Kinetics of Gas Hydrate Film Growth along the Water–Gas Interface

2020 ◽  
Vol 94 (9) ◽  
pp. 1949-1951
Author(s):  
V. A. Vlasov ◽  
A. N. Nesterov ◽  
A. M. Reshetnikov
2013 ◽  
Vol 27 (5) ◽  
pp. 2548-2554 ◽  
Author(s):  
Reuben Wu ◽  
Karen A. Kozielski ◽  
Patrick G. Hartley ◽  
Eric F. May ◽  
John Boxall ◽  
...  

2004 ◽  
Vol 338-340 ◽  
pp. 13-18 ◽  
Author(s):  
G.M. Ferreira ◽  
A.S. Ferlauto ◽  
Chi Chen ◽  
R.J. Koval ◽  
J.M. Pearce ◽  
...  

1964 ◽  
Vol 19 (7-8) ◽  
pp. 835-843 ◽  
Author(s):  
H. Poppa

Early stages of oriented overgrowth of Ag, Au, and Pd on thin, single-crystal substrates of mica, molybdenite, Au and Pd were studied by high-resolution electron microscopy and diffraction. Cleaning of substrate surfaces and deposition of evaporated materials were conducted inside an electron microscope. High-magnification, continuous observation during growth permitted investigation of the kinetics of growth. A number of probably elementary epitaxial processes were studied in detail. Nucleation and growth behavior was examined for different supersaturations and free surface energies of substrate and overgrowth materials. The influence of alloying on growth and the spacing of parallel moiré structures was investigated.


2000 ◽  
Vol 07 (01n02) ◽  
pp. 135-139 ◽  
Author(s):  
V. P. ZHDANOV ◽  
P. R. NORTON

A seminal model describing the kinetics of growth of thin oxide films on metal crystals was proposed by Cabrera and Mott (CM). The model is based on the assumption that the growth is limited by the field-facilitated activated jumps of metal ions located in steps on the metal–oxide interface. We generalize the CM model by (i) exploring the interplay of jumps of metal ions from the step and terrace sites at the metal–oxide interface, and (ii) scrutinizing the processes at the oxide–gas-phase interface. The former factor is found to change the physical meaning of the parameters in the CM growth law. The latter factor results in modification of the growth law. In particular, the oxidation kinetics becomes dependent on the O2 pressure. More specifically, the oxidation rate is predicted to increase with increasing pressure. This effect is, however, rather weak and becomes progressively weaker with increasing oxide film thickness.


2010 ◽  
Author(s):  
A. Stoilova ◽  
P. Petkov ◽  
Y. Nedeva ◽  
B. Monchev ◽  
Angelos Angelopoulos ◽  
...  
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document