Thermal Migration of Melted Zones over the Silicon Surface under Thermal Shock

2020 ◽  
Vol 46 (4) ◽  
pp. 374-377
Author(s):  
A. A. Skvortsov ◽  
M. V. Koryachko ◽  
M. R. Rybakova
Author(s):  
W. J. Abramson ◽  
H. W. Estry ◽  
L. F. Allard

LaB6 emitters are becoming increasingly popular as direct replacements for tungsten filaments in the electron guns of modern electron-beam instruments. These emitters offer order of magnitude increases in beam brightness, and, with appropriate care in operation, a corresponding increase in source lifetime. They are, however, an order of magnitude more expensive, and may be easily damaged (by improper vacuum conditions and thermal shock) during saturation/desaturation operations. These operations typically require several minutes of an operator's attention, which becomes tedious and subject to error, particularly since the emitter must be cooled during sample exchanges to minimize damage from random vacuum excursions. We have designed a control system for LaBg emitters which relieves the operator of the necessity for manually controlling the emitter power, minimizes the danger of accidental improper operation, and makes the use of these emitters routine on multi-user instruments.Figure 1 is a block schematic of the main components of the control system, and Figure 2 shows the control box.


Author(s):  
T. Sato ◽  
S. Kitamura ◽  
T. Sueyoshl ◽  
M. Iwatukl ◽  
C. Nielsen

Recently, the growth process and relaxation process of crystalline structures were studied by observing a SI nano-pyramid which was built on a Si surface with a UHV-STM. A UHV-STM (JEOL JSTM-4000×V) was used for studying a heated specimen, and the specimen was kept at high temperature during observation. In this study, the nano-fabrication technique utilizing the electromigration effect between the STM tip and the specimen was applied. We observed Si atoms migrated towords the tip on a high temperature Si surface.Clean surfaces of Si(lll)7×7 and Si(001)2×l were prepared In the UHV-STM at a temperature of approximately 600 °C. A Si nano-pyramid was built on the Si surface at a tunneling current of l0nA and a specimen bias voltage of approximately 0V in both polarities. During the formation of the pyramid, Images could not be observed because the tip was stopped on the sample. After the formation was completed, the pyramid Image was observed with the same tip. After Imaging was started again, the relaxation process of the pyramid started due to thermal effect.


Author(s):  
O.L. Krivanek ◽  
G.J. Wood

Electron microscopy at 0.2nm point-to-point resolution, 10-10 torr specimei region vacuum and facilities for in-situ specimen cleaning presents intere; ing possibilities for surface structure determination. Three methods for examining the surfaces are available: reflection (REM), transmission (TEM) and profile imaging. Profile imaging is particularly useful because it giv good resolution perpendicular as well as parallel to the surface, and can therefore be used to determine the relationship between the surface and the bulk structure.


1983 ◽  
Vol 44 (2) ◽  
pp. 257-261 ◽  
Author(s):  
B.K. Chakraverty
Keyword(s):  

2013 ◽  
Vol 51 (10) ◽  
pp. 729-734 ◽  
Author(s):  
Seol Jeon ◽  
Youngkue Choi ◽  
Hyun-Gyoo Shin ◽  
Hyun Park ◽  
Heesoo Lee ◽  
...  

2015 ◽  
Vol 30 (12) ◽  
pp. 1261
Author(s):  
ZHANG Xiao-Feng ◽  
ZHOU Ke-Song ◽  
ZHANG Ji-Fu ◽  
ZHANG Yong ◽  
LIU Min ◽  
...  

2014 ◽  
Vol 59 (1) ◽  
pp. 355-358
Author(s):  
M. Karaś ◽  
M. Nowak ◽  
M. Opyrchał ◽  
M. Bigaj ◽  
A. Najder

Abstract In this study, the effect of zinc interlayer on the adhesion of nickel coatings reinforced with micrometric Al2O3 particles was examined. Nickel coating was applied by electroplating on EN AW - 5754 aluminium alloy using Watts bath at a concentration of 150 g/l of nickel sulphate with the addition of 50 g/l of Al2O3. The influence of zinc intermediate coating deposited in single, double and triple layers on the adhesion of nickel coating to aluminium substrate was also studied. The adhesion was measured by the thermal shock technique in accordance with PN-EN ISO 2819. The microhardness of nickel coating before and after heat treatment was additionally tested. It was observed that the number of zinc interlayers applied does not significantly affect the adhesion of nickel which is determined by thermal shock. No defect that occurs after the test, such as delamination, blistering or peeling of the coating was registered. Microhardness of the nickel coatings depends on the heat treatment and the amount of zinc in the interlayer. For both single and double zinc interlayer, the microhardness of the nickel coating containing Al2O3 particles increased after heat treatment, but decreased when a triple zinc interlayer was applied.


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