An examination of centrifugal barrier effects in iodine pentafluoride by inner shell electron energy loss spectroscopy

1994 ◽  
Vol 72 (11-12) ◽  
pp. 1093-1100
Author(s):  
Glyn Cooper ◽  
Wenzhu Zhang ◽  
C. E. Brion

Electron energy loss spectroscopy was used to study the core (I 4d, I 3d, and F Is) level electronic excitation spectra of IF5. The spectra were collected under experimental conditions such that dipole transitions were dominant (high electron impact energy (3 keV) and 0° scattering angle). The spectra were assigned using term value arguments, and by analogy with those of the isoelectronic molecules TeF6 and XeF4. In common with the spectra of TeF6 and XeF4, the spectra of IF5 show features that are consistent with a centrifugal potential-barrier model. In particular, transitions to virtual valence orbitals and to above-edge shape resonance channels are relatively intense, whereas transitions to Rydberg orbitals are, in comparison, very weak or absent. As in the case of TeF6, it was necessary to include atomic 4f orbitals in the molecular orbital basis to adequately account for the continuum resonance features observed in the IF5 spectra. The valence shell electron energy loss spectrum of IF5 from 5 to 35 eV was also obtained.

2020 ◽  
Vol 6 (28) ◽  
pp. eabb4713
Author(s):  
Renwen Yu ◽  
F. Javier García de Abajo

We explore a disruptive approach to nanoscale sensing by performing electron energy loss spectroscopy through the use of low-energy ballistic electrons that propagate on a two-dimensional semiconductor. In analogy to free-space electron microscopy, we show that the presence of analyte molecules in the vicinity of the semiconductor produces substantial energy losses in the electrons, which can be resolved by energy-selective electron injection and detection through actively controlled potential gates. The infrared excitation spectra of the molecules are thereby gathered in this electronic device, enabling the identification of chemical species with high sensitivity. Our realistic theoretical calculations demonstrate the superiority of this technique for molecular sensing, capable of performing spectral identification at the zeptomol level within a microscopic all-electrical device.


2014 ◽  
Vol 20 (3) ◽  
pp. 779-783 ◽  
Author(s):  
Paolo Longo ◽  
Ray D. Twesten ◽  
Jaco Olivier

AbstractWe report the analysis of the changes in local carbon structure and chemistry caused by the self-implantation of carbon into diamond via electron energy-loss spectroscopy (EELS) plasmon energy shifts and core-edge fine structure fingerprinting. These two very different EELS energy and intensity ranges of the spectrum can be acquired under identical experimental conditions and nearly simultaneously using specially designed deflectors and energy offset devices known as “DualEELS.” In this way, it is possible to take full advantage of the unique and complementary information that is present in the low- and core-loss regions of the EELS spectrum. We find that self-implanted carbon under the implantation conditions used for the material investigated in this paper creates an amorphous region with significant sp2 content that varies across the interface.


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