PIXE STUDIES USING THE VAN-DE-GRAAFF ACCELEARTOR AT BARC, TROMBAY – DIFFERENCES IN ELEMENTAL CONCENTARTIONS IN BLOOD SAMPLES OF CHILDREN

Metal monitoring is one of the major concern of biological and bio-medical research. The Proton Induced X-ray Emission (PIXE) which is a multi elemental and non-destructive technique for trace element analysis has been set up at the Folded Tandem Ion accelerator (FOTIA) at BARC, Trombay, Mumbai, India. A few of the bioscience applications carried out at the Van de Graaff Laboratory using PIXE will be summarized in this presentation. Tea leaves obtained from the eastern region of India were analyzed by PIXE using 2.5 MeV protons. Trace elements such K , Ca , Ti , Cr , Ni , Mn , Fe , Cu , Zn , Rb and Sr were present in varying concentration in the tea leaves. The soil analysis showed Ti , Y , Zr and Nb in addition to the elements shown in the leaves. Blood samples of children exposed to vehicular traffic exhaust were analyzed for its Pb content and it was seen that the concentrations of Pb in the blood of the children were high (6.0 μg/ml). Pb poisoning of air due to vehicular exhaust is a major concern and cause for air pollution leading to high blood lead levels in children.

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Trace element analysis of blood samples from mentally challenged children by PIXE

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/s0168-583x(01)01282-4 ◽

2002 ◽

Vol 190 (1-4) ◽

pp. 449-452 ◽

Cited By ~ 7

Author(s):

R. Ashok Kumar ◽

V. John Kennedy ◽

K. Sasikala ◽

A.L.C. Jude ◽

M. Ashok ◽

...

Keyword(s):

Trace Element ◽

Trace Element Analysis ◽

Element Analysis ◽

Blood Samples

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Direct Trace Element Analysis of Liquid Blood Samples by In-Air Ion Beam Analytical Techniques (PIXE–PIGE)

Analytical Chemistry ◽

10.1021/acs.analchem.6b03541 ◽

2017 ◽

Vol 89 (3) ◽

pp. 1558-1564 ◽

Cited By ~ 6

Author(s):

Robert Huszank ◽

László Csedreki ◽

Zsófia Török

Keyword(s):

Trace Element ◽

Ion Beam ◽

Trace Element Analysis ◽

Analytical Techniques ◽

Element Analysis ◽

Blood Samples

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Trace-element Analysis of Volcanic Glass Shards by Laser Ablation ICP-MS for Forensic Soil Analysis

BUNSEKI KAGAKU ◽

10.2116/bunsekikagaku.67.485 ◽

2018 ◽

Vol 67 (8) ◽

pp. 485-491 ◽

Cited By ~ 3

Author(s):

Teppei NOGAMI ◽

Yoshinari ABE ◽

Izumi NAKAI

Keyword(s):

Laser Ablation ◽

Trace Element ◽

Soil Analysis ◽

Trace Element Analysis ◽

Volcanic Glass ◽

Element Analysis ◽

Icp Ms ◽

Glass Shards

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Clinical and Sub-clinical Lead Poisoning: A Laboratory Perspective

Human Toxicology ◽

10.1177/096032718800700518 ◽

1988 ◽

Vol 7 (5) ◽

pp. 503-513 ◽

Cited By ~ 5

Author(s):

R.A. Braithwaite ◽

S.S. Brown

Keyword(s):

Occupational Exposure ◽

Clinical Laboratory ◽

Trace Element Analysis ◽

Blood Lead ◽

Zinc Protoporphyrin ◽

Accuracy Control ◽

Element Analysis ◽

Laboratory Methods ◽

Index Of Exposure ◽

Clinical Lead Poisoning

1 The background, scope and limitations of laboratory methods for the diagnosis of inorganic dead poisoning are outlined in the context of the work of a specialist clinical laboratory for trace element analysis. 2 Data for blood lead, haemoglobin and erythrocyte zinc protoporphyrin concentrations are presented in cases of clinical and sub-clinical poisoning due to accidental or occupational exposure. 3 Data from population surveys of children and adults subject to either environmental or occupational exposure are also shown. 4 In general, analysis for lead in an appropriate specimen of blood offers the single most useful index of exposure. 5 The importance of good accuracy control in such measurements is emphasized.

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An improved interference correction for trace element analysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100132868 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1646-1647

Author(s):

John J. Donovan ◽

Donald A. Snyder ◽

Mark L. Rivers

Keyword(s):

Trace Element Analysis ◽

Accurate Estimate ◽

Simple Expression ◽

Standard Reference Materials ◽

Characteristic Line ◽

Analytical Line ◽

Element Analysis ◽

Electron Probe Analysis ◽

Calculated Concentration ◽

X Ray

We present a simple expression for the quantitative treatment of interference corrections in x-ray analysis. WDS electron probe analysis of standard reference materials illustrate the success of the technique.For the analytical line of wavelength λ of any element A which lies near or on any characteristic line of another element B, the observed x-ray counts at We use to denote x-ray counts excited by element i in matrix j (u=unknown; s=analytical standard; ŝ=interference standard) at the wavelength of the analytical line of A, λA (Fig. 1). Quantitative analysis of A requires an accurate estimate of These counts can be estimated from the ZAF calculated concentration of B in the unknown C,Bu measured counts at λA in an interference standard of known concentration of B (and containing no A), and ZAF correction parameters for the matrices of both the unknown and the interference standard at It can be shown that:

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Trace Element Analysis in Biological Specimens

10.1016/s0167-9244(08)x7008-8 ◽

1994 ◽

Keyword(s):

Trace Element ◽

Trace Element Analysis ◽

Element Analysis

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Reconstructing sea turtle ontogenetic habitat shifts through trace element analysis of bone tissue

Marine Ecology Progress Series ◽

10.3354/meps12796 ◽

2019 ◽

Vol 608 ◽

pp. 247-262 ◽

Cited By ~ 2

Author(s):

MD Ramirez ◽

JA Miller ◽

E Parks ◽

L Avens ◽

LR Goshe ◽

...

Keyword(s):

Trace Element ◽

Bone Tissue ◽

Trace Element Analysis ◽

Sea Turtle ◽

Element Analysis ◽

Ontogenetic Habitat Shifts

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Method of Detecting Trace Metal Contamination in Thick-Film SOI Device

ISTFA 2005: Conference Proceedings from the 31st International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2005p0220 ◽

2005 ◽

Author(s):

Yasunori Goto ◽

Hiroomi Eguchi ◽

Masaru Iida

Keyword(s):

Trace Metal ◽

Thick Film ◽

Metal Contamination ◽

Semiconductor Device ◽

Trace Element Analysis ◽

Silicon On Insulator ◽

Element Analysis ◽

Trace Metal Contamination ◽

Trace Metal Elements ◽

Output Characteristics

Abstract In the automotive IC using thick-film silicon on insulator (SOI) semiconductor device, if the gettering capability of a SOI wafer is inadequate, electrical characteristics degradation by metal contamination arises and the yield falls. At this time, an automotive IC was made experimentally for evaluation of the gettering capability as one of the purposes. In this IC, one of the output characteristics varied from the standard, therefore failure analysis was performed, which found trace metal elements as one of the causes. By making full use of 3D perspective, it is possible to fabricate a site-specific sample into 0.1 micrometre in thickness without missing a failure point that has very minute quantities of contaminant in a semiconductor device. Using energy dispersive X-ray, it is possible to detect trace metal contamination at levels 1E12 atoms per sq cm. that are conventionally detected only by trace element analysis.

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