NOISE CHARACTERISTICS OF 340 nm AND 280 nmGaN-BASED LIGHT EMITTING DIODES

2004 ◽  
Vol 14 (03) ◽  
pp. 702-707
Author(s):  
SHAYLA SAWYER ◽  
SERGEY L. RUMYANTSEV ◽  
NEZIH PALA ◽  
MICHAEL S. SHUR ◽  
YURIY BILENKO ◽  
...  
Keyword(s):  
Light Intensity ◽  
Quality Factor ◽  
Light Emitting Diodes ◽  
Low Frequency ◽  
Low Frequencies ◽  
Light Emitting ◽  
Visible Wavelength ◽  
Noise Characteristics ◽  
Uv Leds ◽  
Halogen Lamps

Low frequency fluctuations in light intensity of 340 nm and 280 nm GaN -based light emitting diodes (LEDs) are compared with noise properties of other commercially available UV and visible wavelength LEDs and halogen lamps. At low frequencies, LEDs can exhibit lower levels of noise than halogen lamps. An LED noise quality factor β is estimated for the UV LEDs.

Reliability investigation of light-emitting diodes via low frequency noise characteristics

2015 ◽  
Vol 55 (1) ◽  
pp. 52-61 ◽  
Author(s):  
Sandra Pralgauskaitė ◽  
Vilius Palenskis ◽  
Jonas Matukas ◽  
Justinas Glemža ◽  
Grigorij Muliuk ◽  
...  
Keyword(s):  
Light Emitting Diodes ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Light Emitting ◽  
Noise Characteristics

scholarly journals Low-frequency noise of near UV LEDs

2019 ◽  
Vol 59 (3) ◽  
Author(s):  
Justinas Glemža ◽  
Sandra Pralgauskaitė ◽  
Vilius Palenskis ◽  
Jonas Matukas
Keyword(s):  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Peak Wavelength ◽  
Light Emitting ◽  
Near Ultraviolet ◽  
Noise Characteristics ◽  
Noise Spectroscopy ◽  
Uv Leds ◽  
Noise Spectra

Low-frequency noise characteristics of high power near ultraviolet light-emitting diodes (LEDs) with peak radiative wavelengths in a range of 380–410 nm are investigated in a temperature interval of 110–293 K. The defect-assisted tunnelling current component has been observed in some 380 nm peak wavelength samples with corresponding Lorentzian-type electrical noise spectra. Other samples (with a peak wavelength of 390–410 nm) have mainly 1/fα-type electrical fluctuations. Cross-correlation coefficient analysis between electrical and optical fluctuations has been performed in order to evaluate whether the observed defect levels, responsible for additional generation–recombination (g–r) noise components in LEDs noise spectra, are related to the active layer or to the peripheral area of the device. Activation energies of these g–r centres have been also evaluated using g–r noise spectroscopy.

scholarly journals 310 nm UV-LEDs attenuate imiquimod-induced psoriasis-like skin lesions in C57BL/6 mice and inhibit IL-22-induced STAT3 expression in HaCaT cells

2020 ◽  
Vol 19 (8) ◽  
pp. 1009-1021
Author(s):  
Tae-Rin Kwon ◽  
Sung-Eun Lee ◽  
Jong Hwan Kim ◽  
You Na Jang ◽  
Su-Young Kim ◽  
...  
Keyword(s):  
Light Source ◽  
Ultraviolet Light ◽  
Light Emitting Diodes ◽  
Skin Lesions ◽  
Hacat Cells ◽  
Light Emitting ◽  
Uv Leds ◽  
Ultraviolet Light Emitting Diodes

Ultraviolet light-emitting diodes (UV-LEDs) are a novel light source for phototherapy.

Development of an Al2O3 filled composite for the bracket of ultraviolet light-emitting diodes (UV-LEDs)

2018 ◽  
Vol 83 ◽  
pp. 356-362 ◽  
Author(s):  
Lei Zhang ◽  
Yiting Zheng ◽  
Jiale Mao ◽  
Shuang Wang ◽  
Ruotian Fu ◽  
...  
Keyword(s):  
Ultraviolet Light ◽  
Light Emitting Diodes ◽  
Light Emitting ◽  
Uv Leds ◽  
Ultraviolet Light Emitting Diodes ◽  
Filled Composite

ACCURATE MEASUREMENT OF ULTRAVIOLET LIGHT-EMITTING DIODES

2021 ◽  
Author(s):  
C. Yuqin Zong ◽  
Cameron Miller
Keyword(s):  
Ultraviolet Light ◽  
Light Emitting Diodes ◽  
Luminous Flux ◽  
Junction Temperature ◽  
Integrating Sphere ◽  
Light Emitting ◽  
Type D ◽  
Uv Led ◽  
Uv Leds ◽  
Ultraviolet Light Emitting Diodes

We have developed a new calibration capability for 200 nm to 400 nm ultraviolet light-emitting diodes (UV LEDs) using a Type D gonio-spectroradiometer. The recently-introduced mean differential continuous pulse (M-DCP) method is used to overcome the measurement difficulty associated with the initial forward voltage, VF, anomaly of a UV LED, which makes it impossible to use VF to infer junction temperature, TJ, during pulsed operation. The new measurement facility was validated indirectly by comparing the measured total luminous flux of a white LED with that measured using the NIST’s 2.5 m absolute integrating sphere. The expanded calibration uncertainty for the total radiant flux is approximately 2 % to 3 % (k = 2) depending the wavelength of the UV LED.

Low-frequency noise of GaN-based ultraviolet light-emitting diodes

2005 ◽  
Vol 97 (12) ◽  
pp. 123107 ◽  
Author(s):  
S. L. Rumyantsev ◽  
S. Sawyer ◽  
M. S. Shur ◽  
N. Pala ◽  
Yu. Bilenko ◽  
...  
Keyword(s):  
Ultraviolet Light ◽  
Light Emitting Diodes ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Light Emitting ◽  
Ultraviolet Light Emitting Diodes
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