STUDY OF THE CONDUCTIVITY OF DIELECTRIC UNDER HIGH ENERGY ELECTRON IRRADIATION

2012 ◽  
Vol 26 (32) ◽  
pp. 1250213
Author(s):  
YIFENG CHEN ◽  
SHENGSHENG YANG ◽  
DETIAN LI ◽  
XIAOGANG QIN ◽  
QING LIU ◽  
...  

High energy electron irradiation was performed on a theoretical and experimental study of the dielectric conductivity. This paper presents a theoretical method to the determination of the conductivity of dielectric materials under irradiation, and the conductivity of kapton is measured under 0.8 MeV electron irradiation. The results from theory and experiment clearly illustrate the expected dependence of conductivity of dielectric on dose rate, and the resistance of kapton decreases in 102.

Author(s):  
L. -M. Peng ◽  
M. J. Whelan

In recent years there has been a trend in the structure determination of reconstructed surfaces to use high energy electron diffraction techniques, and to employ a kinematic approximation in analyzing the intensities of surface superlattice reflections. Experimentally this is motivated by the great success of the determination of the dimer adatom stacking fault (DAS) structure of the Si(111) 7 × 7 reconstructed surface.While in the case of transmission electron diffraction (TED) the validity of the kinematic approximation has been examined by using multislice calculations for Si and certain incident beam directions, far less has been done in the reflection high energy electron diffraction (RHEED) case. In this paper we aim to provide a thorough Bloch wave analysis of the various diffraction processes involved, and to set criteria on the validity for the kinematic analysis of the intensities of the surface superlattice reflections.The validity of the kinematic analysis, being common to both the TED and RHEED case, relies primarily on two underlying observations, namely (l)the surface superlattice scattering in the selvedge is kinematically dominating, and (2)the superlattice diffracted beams are uncoupled from the fundamental diffracted beams within the bulk.


2000 ◽  
Vol 15 (3) ◽  
pp. 461-468
Author(s):  
B.I. Belevtsev ◽  
V.B. Krasovitsky ◽  
V.V. Bobkov ◽  
D.G. Naugle ◽  
K.D.D. Rathnayaka ◽  
...  

2006 ◽  
Vol 52 (3) ◽  
pp. 355-359 ◽  
Author(s):  
P. V. Aleksandrova ◽  
V. K. Gueorguiev ◽  
Tz. E. Ivanov ◽  
S. Kaschieva

2017 ◽  
Vol 110 (8) ◽  
pp. 083503 ◽  
Author(s):  
V. V. Kozlovski ◽  
A. A. Lebedev ◽  
M. E. Levinshtein ◽  
S. L. Rumyantsev ◽  
J. W. Palmour

2014 ◽  
Vol 2 (27) ◽  
pp. 4297-4309 ◽  
Author(s):  
Emilia I. Wisotzki ◽  
Marcel Hennes ◽  
Carsten Schuldt ◽  
Florian Engert ◽  
Wolfgang Knolle ◽  
...  

2017 ◽  
Vol 19 (19) ◽  
pp. 12064-12074 ◽  
Author(s):  
Emilia I. Wisotzki ◽  
Paolo Tempesti ◽  
Emiliano Fratini ◽  
Stefan G. Mayr

Small-angle X-ray scattering revealed ranging structural differences in physically entangled and irradiation-crosslinked gelatin hydrogels.


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