DETECTION OF SPATIAL DISTRIBUTION OF THE TUNNELING CURRENT DISPERSION OF STM
Noise and fluctuations of tunneling current of STM can be analyzed for a surface investigation. The tunnel gap can behave as a passive element, which transforms the noise in the sample–tip-piezodriver system and as an active source of noise due to the stochastic character of polarization and relocation of adsorbed molecules in the near-tip region. A spatial distribution of dispersion of the tunneling current of STM operated in air was detected. The samples of Cu, Nb, C (graphite), Pb, Zn, SnO 2, Si were studied. The regions with a high dispersion value formed dots, spots and lines. During several sequence scannings of surface by tip some spots can vanish. The connection of the observed dispersion with relief features and with the picture of the barrier height distribution is discussed. The simple model of the noise source is proposed.