Strong Semilattices of Implicative Semigroups

2008 ◽  
Vol 15 (01) ◽  
pp. 53-62
Author(s):  
Shuk Yee Lee ◽  
K. P. Shum ◽  
Congxin Wu
Keyword(s):  
Analogous Result ◽  
Practical Method ◽  
Main Difficulty ◽  
Large Size ◽  
Semilattice Of Semigroups ◽  
Strong Semilattice ◽  
Strong Semilattice Of Semigroups

It is well known that a strong semilattice of semigroups is still a semigroup. However, it is not known whether the analogous result carries or not for a strong semilattice of implicative semigroups. The main difficulty is that the implicative operation ∗ is hard to define on the semilattice, especially we need the operation ∗ of the implicative semigroup to be compatible with the negatively ordered relation and the semigroup multiplication on the semilattice of implicative semigroups. In this paper, we provide a practical method of constructing such a strong semilattice of mplicative semigroups. Our method is particularly useful in constructing implicative semigroups of large size. A constructed example is given.

A Structure Theorem of Regular ${\cal H}^\sharp$-Cryptographs

2008 ◽  
Vol 15 (04) ◽  
pp. 653-666 ◽  
Author(s):  
Xiangzhi Kong ◽  
Zhiling Yuan ◽  
K. P. Shum
Keyword(s):  
Structure Theorem ◽  
Abundant Semigroup ◽  
Regular Semigroups ◽  
Completely Regular ◽  
Abundant Semigroups ◽  
Completely Regular Semigroups ◽  
Semilattice Of Semigroups ◽  
Strong Semilattice ◽  
Green Relations ◽  
Strong Semilattice Of Semigroups

A new set of generalized Green relations is given in studying the [Formula: see text]-abundant semigroups. By using the generalized strong semilattice of semigroups recently developed by the authors, we show that an [Formula: see text]-abundant semigroup is a regular [Formula: see text]-cryptograph if and only if it is an [Formula: see text]-strong semilattice of completely [Formula: see text]-simple semigroups. This result not only extends the well known result of Petrich and Reilly from the class of completely regular semigroups to the class of semiabundant semigroups, but also generalizes a well known result of Fountain on superabundant semigroups from the class of abundant semigroups to the class of semiabundant semigroups.

scholarly journals Set-theoretic solutions to the Yang–Baxter equation and generalized semi-braces

2021 ◽  
Vol 0 (0) ◽  
Author(s):  
Francesco Catino ◽  
Ilaria Colazzo ◽  
Paola Stefanelli
Keyword(s):  
Finite Order ◽  
Algebraic Structure ◽  
Baxter Equation ◽  
Construction Technique ◽  
Semilattice Of Semigroups ◽  
Strong Semilattice ◽  
New Construction ◽  
Strong Semilattice Of Semigroups

Abstract This paper aims to introduce a construction technique of set-theoretic solutions of the Yang–Baxter equation, called strong semilattice of solutions. This technique, inspired by the strong semilattice of semigroups, allows one to obtain new solutions. In particular, this method turns out to be useful to provide non-bijective solutions of finite order. It is well-known that braces, skew braces and semi-braces are closely linked with solutions. Hence, we introduce a generalization of the algebraic structure of semi-braces based on this new construction technique of solutions.

scholarly journals The strong nil-cleanness of semigroup rings

2020 ◽  
Vol 18 (1) ◽  
pp. 1491-1500
Author(s):  
Yingdan Ji
Keyword(s):  
Inverse Semigroup ◽  
Simple Semigroup ◽  
Semigroup Ring ◽  
Semigroup Rings ◽  
Locally Inverse Semigroup ◽  
Semilattice Of Semigroups ◽  
Strong Semilattice ◽  
Alpha Beta ◽  
Strong Semilattice Of Semigroups

Abstract In this paper, we study the strong nil-cleanness of certain classes of semigroup rings. For a completely 0-simple semigroup M={ {\mathcal M} }^{0}(G;I,\text{Λ};P) , we show that the contracted semigroup ring {R}_{0}{[}M] is strongly nil-clean if and only if either |I|=1 or |\text{Λ}|=1 , and R{[}G] is strongly nil-clean; as a corollary, we characterize the strong nil-cleanness of locally inverse semigroup rings. Moreover, let S={[}Y;{S}_{\alpha },{\varphi }_{\alpha ,\beta }] be a strong semilattice of semigroups, then we prove that R{[}S] is strongly nil-clean if and only if R{[}{S}_{\alpha }] is strongly nil-clean for each \alpha \in Y .

UNIVERSAL SIZE EFFECT STUDIES USING THREE POINT BEAM TESTS

2016 ◽  
Vol 3 (1) ◽  
Author(s):  
Siddik Şener ◽  
Kadir Can Şener
Keyword(s):  
Size Effect ◽  
Asymptotic Properties ◽  
Main Difficulty ◽  
Fracture Test ◽  
Three Point Bending ◽  
Large Size ◽  
Nominal Strength ◽  
Notch Length

The universal size effect law for concrete is a law that describes the dependence of nominal strength of specimen or structure on both its size and the crack (or notch) length, over the entire of interest, and exhibits the correct small and large size asymptotic properties as required. The main difficulty has been the transition of crack length from 0, in which case the size effect mode is Type 1, to deep cracks (or notches), in which case the size effect mode is Type 2 and fundamentally different from Type 1. The current study is based on recently obtained comprehensive fracture test data from three-point bending beams tested under identical conditions. This paper presents a studying to improve the existing universal size effect law using the experimentally obtained beam strengths for various different specimen sizes and all notch depths. The updated universal size effect law is shown to fit the comprehensive data quite well.

Completely Regular Semigroups with Generalized Strong Semilattice Decompositions

2005 ◽  
Vol 12 (02) ◽  
pp. 269-280 ◽  
Author(s):  
Xiangzhi Kong ◽  
K. P. Shum
Keyword(s):  
Sufficient Conditions ◽  
Normal Band ◽  
Regular Semigroups ◽  
Completely Regular ◽  
Green’S Relation ◽  
Completely Regular Semigroups ◽  
Semilattice Of Semigroups ◽  
Strong Semilattice ◽  
Necessary And Sufficient ◽  
Characterization Theorems

The concept of ρG-strong semilattice of semigroups is introduced. By using this concept, we study Green's relation ℋ on a completely regular semigroup S. Necessary and sufficient conditions for S/ℋ to be a regular band or a right quasi-normal band are obtained. Important results of Petrich and Reilly on regular cryptic semigroups are generalized and enriched. In particular, characterization theorems of regular cryptogroups and normal cryptogroups are obtained.

Coherency loss in γ' precipitates in nickel-base superalloy

1983 ◽  
Vol 41 ◽  
pp. 244-245
Author(s):  
R. A. Ricks ◽  
Angus J. Porter
Keyword(s):  
Lattice Mismatch ◽  
Lattice Parameter ◽  
Nickel Base Superalloy ◽  
Large Size ◽  
The Matrix ◽  
Nimonic 80A ◽  
Interfacial Dislocations ◽  
Nickel Base ◽  
Coherency Loss ◽  
Nimonic 115

During a recent investigation concerning the growth of γ' precipitates in nickel-base superalloys it was observed that the sign of the lattice mismatch between the coherent particles and the matrix (γ) was important in determining the ease with which matrix dislocations could be incorporated into the interface to relieve coherency strains. Thus alloys with a negative misfit (ie. the γ' lattice parameter was smaller than the matrix) could lose coherency easily and γ/γ' interfaces would exhibit regularly spaced networks of dislocations, as shown in figure 1 for the case of Nimonic 115 (misfit = -0.15%). In contrast, γ' particles in alloys with a positive misfit could grow to a large size and not show any such dislocation arrangements in the interface, thus indicating that coherency had not been lost. Figure 2 depicts a large γ' precipitate in Nimonic 80A (misfit = +0.32%) showing few interfacial dislocations.

The role of differential phase contrast in electron microscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 176-177
Author(s):  
E.M. Waddell ◽  
J.N. Chapman ◽  
R.P. Ferrier
Keyword(s):  
Phase Contrast ◽  
Practical Method ◽  
Position Vector ◽  
Differential Phase ◽  
Pure Phase ◽  
Differential Phase Contrast ◽  
The Difference ◽  
Image Position ◽  
First Moment

Dekkers and de Lang (1977) have discussed a practical method of realising differential phase contrast in a STEM. The method involves taking the difference signal from two semi-circular detectors placed symmetrically about the optic axis and subtending the same angle (2α) at the specimen as that of the cone of illumination. Such a system, or an obvious generalisation of it, namely a quadrant detector, has the characteristic of responding to the gradient of the phase of the specimen transmittance. In this paper we shall compare the performance of this type of system with that of a first moment detector (Waddell et al.1977).For a first moment detector the response function R(k) is of the form R(k) = ck where c is a constant, k is a position vector in the detector plane and the vector nature of R(k)indicates that two signals are produced. This type of system would produce an image signal given bywhere the specimen transmittance is given by a (r) exp (iϕ (r), r is a position vector in object space, ro the position of the probe, ⊛ represents a convolution integral and it has been assumed that we have a coherent probe, with a complex disturbance of the form b(r-ro) exp (iζ (r-ro)). Thus the image signal for a pure phase object imaged in a STEM using a first moment detector is b2 ⊛ ▽ø. Note that this puts no restrictions on the magnitude of the variation of the phase function, but does assume an infinite detector.

Automatic analysis of Kikuchi diffraction patterns

1994 ◽  
Vol 52 ◽  
pp. 900-901
Author(s):  
H. Weiland ◽  
D. P. Field
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Spatial Resolution ◽  
Relevant Information ◽  
Crystalline Materials ◽  
Large Size ◽  
Transmission Electron ◽  
New Type ◽  
Diffraction Patterns ◽  
Orientation Determination

Recent advances in the automatic indexing of backscatter Kikuchi diffraction patterns on the scanning electron microscope (SEM) has resulted in the development of a new type of microscopy. The ability to obtain statistically relevant information on the spatial distribution of crystallite orientations is giving rise to new insight into polycrystalline microstructures and their relation to materials properties. A limitation of the technique in the SEM is that the spatial resolution of the measurement is restricted by the relatively large size of the electron beam in relation to various microstructural features. Typically the spatial resolution in the SEM is limited to about half a micron or greater. Heavily worked structures exhibit microstructural features much finer than this and require resolution on the order of nanometers for accurate characterization. Transmission electron microscope (TEM) techniques offer sufficient resolution to investigate heavily worked crystalline materials.Crystal lattice orientation determination from Kikuchi diffraction patterns in the TEM (Figure 1) requires knowledge of the relative positions of at least three non-parallel Kikuchi line pairs in relation to the crystallite and the electron beam.

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