Measurement of Elastic Constants of MBE Grown (Ga0.5Al0.5)As Mixed Thin Film Crystal by Diffuse X-Ray Scattering

1986 ◽  
Vol 25 (Part 1, No. 9) ◽  
pp. 1317-1322 ◽  
Author(s):  
Nobuo Kashiwagura ◽  
Yasuharu Kashihara ◽  
Jimpei Harada
Keyword(s):  
Thin Film ◽  
Elastic Constants ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

scholarly journals Precise and nondestructive characterization of a ‘buried’ nanostructure in a polymer thin film using synchrotron radiation ultra-small angle X-ray scattering

2012 ◽  
Vol 45 (3) ◽  
pp. 307-312 ◽  
Author(s):  
Takamichi Shinohara ◽  
Tomoko Shirahase ◽  
Daiki Murakami ◽  
Taiki Hoshino ◽  
Moriya Kikuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Synchrotron Radiation ◽  
Small Angle ◽  
Polymer Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Nondestructive Characterization ◽  
Ray Scattering

Grazing-incidence X-ray scattering of lamellar thin films

2019 ◽  
Vol 52 (2) ◽  
pp. 247-251
Author(s):  
Detlef-M. Smilgies
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Small Molecules ◽  
Film Studies ◽  
Grazing Incidence ◽  
Semicrystalline Polymers ◽  
X Ray ◽  
X Ray Scattering ◽  
Incident Plane ◽  
Ray Scattering

Recently, surface and thin-film studies using area detectors have become prevalent. An important class of such systems are lamellar thin films formed by small molecules, liquid crystals or semicrystalline polymers. Frequently, the lamellae align more or less parallel to the substrate. Such structures can be easily discerned by their characteristic X-ray scattering close to the incident plane. This paper describes how such patterns can be simulated, in order to extract morphological information about the thin film.

scholarly journals Characterization of Lipid-Templated Silica and Hybrid Thin Film Mesophases by Grazing Incidence Small-Angle X-ray Scattering

Langmuir ◽  
2009 ◽  
Vol 25 (16) ◽  
pp. 9500-9509 ◽  
Author(s):  
Darren R. Dunphy ◽  
Todd M. Alam ◽  
Michael P. Tate ◽  
Hugh W. Hillhouse ◽  
Bernd Smarsly ◽  
...  
Keyword(s):  
Thin Film ◽  
Small Angle ◽  
Grazing Incidence ◽  
Hybrid Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Determination of polarity in noncentrosymmetric layer/substrate systems

1999 ◽  
Vol 32 (5) ◽  
pp. 854-858 ◽  
Author(s):  
Dirk C. Meyer ◽  
Kurt Richter ◽  
Hans-Georg Krane ◽  
Wolfgang Morgenroth ◽  
Peter Paufler
Keyword(s):  
Thin Film ◽  
Gaas Substrate ◽  
Energy Dispersive ◽  
Energy Spectra ◽  
Routine Procedure ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Energy-dispersive anomalous X-ray scattering has been used for the determination of the polarity of a noncentrosymmetric layer/substrate system. The method was applied to an epitaxically grown (Ga,In)P layer on a (001) GaAs substrate as an example to show its applicability as a routine procedure for noncentrosymmetric thin-film systems. In the simplest case, four energy spectra of various orders of the 111 reflections were sufficient to identify polarity, without the need for intensity corrections.

scholarly journals Magnetism in heterogeneous thin film systems: Resonant X-ray scattering studies

2003 ◽  
Vol 199 ◽  
pp. 301-307 ◽  
Author(s):  
J.B. Kortright ◽  
J.S. Jiang ◽  
S.D. Bader ◽  
O. Hellwig ◽  
D.T. Marguiles ◽  
...  
Keyword(s):  
Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

X-ray scattering from two-dimensionally patterned magnetic thin film nanoscale arrays

2007 ◽  
Vol 41 (2-3) ◽  
pp. 163-167 ◽  
Author(s):  
D.S. Eastwood ◽  
T.P.A. Hase ◽  
M. van Kampen ◽  
R. Bručas ◽  
B. Hjörvarsson ◽  
...  
Keyword(s):  
Thin Film ◽  
Magnetic Thin Film ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering
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