High Resolution of Magnetic Force Microscope Image using a Just-on-Surface Magnetic Force Microscope

1994 ◽  
Vol 33 (Part 1, No. 6B) ◽  
pp. 3779-3784 ◽  
Author(s):  
Sumio Hosaka ◽  
Atsushi Kikukawa ◽  
Yukio Honda
Keyword(s):  
High Resolution ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Microscope Image ◽  
Magnetic Force Microscope Image

scholarly journals MAGNETIC FORCE MICROSCOPE IMAGE EVALUATION OF MAGNETIC IRON OXIDE FLOPPY DISC WITH VARIOUS LIFT HEIGHTS

2020 ◽  
Vol 21 (3) ◽  
pp. 97
Author(s):  
Nanda Shabrina ◽  
Mardiyanto Mardiyanto ◽  
Abu Khalid Rivai
Keyword(s):  
Iron Oxide ◽  
Magnetic Force ◽  
Materials Science ◽  
Sample Surface ◽  
Magnetic Force Microscope ◽  
Image Evaluation ◽  
Microscope Image ◽  
Magnetic Iron Oxide ◽  
Floppy Disc ◽  
Magnetic Force Microscope Image

Magnetic Force Microscope Image Evaluation of Magnetic Iron Oxide Floppy Disc with Various Lift Heights. One of the advantages of Scanning Probe Microscopes (SPM) or better known as the Atomic Force Microscope (AFM) is its ability to "see" in detail at the level of atoms and molecules, so as to improve understanding of how a system works and leads to new discoveries in areas such as life science, materials science, electrochemistry, polymer science, biophysics, nanotechnology and biotechnology. To understand about the MFM mode, amplitude, phase and topographic image, a piece of a flop-py disk as references sample was used in various lift heights. In this paper presented the principles of AFM work and explain the necessary components of such equipment. The MFM images were taken in floating operation method at different heights namely 30, 40 and 60 nm between the surface sample and Co-Cr cantilever tip. Result showed the distance between the cantilever tip to the sample surface influenced the image quality. The best amplitude image could be taken in 60 nm distance.

Fabrication of Magnetic Tips for High-Resolution Magnetic Force Microscopy

2013 ◽  
Vol 543 ◽  
pp. 35-38 ◽  
Author(s):  
Masaaki Futamoto ◽  
Tatsuya Hagami ◽  
Shinji Ishihara ◽  
Kazuki Soneta ◽  
Mitsuru Ohtake
Keyword(s):  
Magnetic Material ◽  
High Resolution ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Force Microscopy ◽  
High Magnetic Moment ◽  
Tip Radius ◽  
Better Than ◽  
Sputtering System

Effects of magnetic material, coating thickness, and tip radius on magnetic force microscope (MFM) spatial resolution have been systematically investigated. MFM tips are prepared by using an UHV sputtering system by coating magnetic materials on non-magnetic Si tips employing targets of Ni, Ni-Fe, Co, Fe, Fe-B, and Fe-Pd. MFM spatial resolutions better than 9 nm have been confirmed by employing magnetic tips coated with high magnetic moment materials with optimized thicknesses.

Erratum: “Magnetic nanowire based high resolution magnetic force microscope probes” [Appl. Phys. Lett. 87, 123507 (2005)]

2005 ◽  
Vol 87 (22) ◽  
pp. 229901
Author(s):  
G. Yang ◽  
J. Tang ◽  
S. Kato ◽  
Q. Zhang ◽  
L. C. Qin ◽  
...  
Keyword(s):  
High Resolution ◽  
Magnetic Force ◽  
Magnetic Force Microscope ◽  
Magnetic Nanowire

scholarly journals Preparation of high-resolution magnetic force microscope tips coated with Co and FeCo films

2013 ◽  
Vol 40 ◽  
pp. 01002 ◽  
Author(s):  
Tatsuya Hagami ◽  
Kazuki Soneta ◽  
Mitsuru Ohtake ◽  
Masaaki Futamoto
Keyword(s):  
High Resolution ◽  
Magnetic Force ◽  
Magnetic Force Microscope

A novel high resolution quantitative magnetic force microscope for hard disk research

2003 ◽  
Author(s):  
P. Kappenberger ◽  
H.J. Hug ◽  
S. Martin ◽  
H.-J. Guntherodt ◽  
D. Buchel ◽  
...  
Keyword(s):  
High Resolution ◽  
Magnetic Force ◽  
Hard Disk ◽  
Magnetic Force Microscope

High-Resolution Magnetic Force Microscope Images of a Magnetic Particle Chain Extracted from Magnetic Bacteria AMB-1

1998 ◽  
Vol 37 (Part 2, No. 11A) ◽  
pp. L1343-L1345 ◽  
Author(s):  
Hitoshi Suzuki ◽  
Tsuyoshi Tanaka ◽  
Tomohito Sasaki ◽  
Noriyuki Nakamura ◽  
Tadashi Matsunaga ◽  
...  
Keyword(s):  
High Resolution ◽  
Magnetic Force ◽  
Magnetic Particle ◽  
Magnetic Force Microscope ◽  
Particle Chain ◽  
Microscope Images

Observation of Magnetic Film Using Magnetic Force Microscope (MFM) in Ultra-High Vacuum (UHV)

2001 ◽  
Vol 7 (S2) ◽  
pp. 866-867
Author(s):  
K. Suzuki ◽  
S. Kitamura ◽  
C. B. Mooney
Keyword(s):  
High Resolution ◽  
Magnetic Force ◽  
High Vacuum ◽  
Phase Variation ◽  
Sample Surface ◽  
Ultra High Vacuum ◽  
Detection Technique ◽  
Magnetic Characteristics ◽  
Magnetic Force Microscope ◽  
Q Factor

In recent years, the magnetic force microscope (MFM) has been used not only for the evaluation of magnetic media but also for the measurement of magnetic characteristics of quantum dots as well as in various fields, because the MFM can visualize magnetic field on the sample surface with the high resolution. The MFM observation in ultra-high vacuum (UHV) requires to reduce the adsorption layer on the sample surface for high resolution observation. The slope detection mode using the variation of vibrating cantilever is basically unstable in UHV due to the increase in the Q factor of the cantilever. Accordingly it has been used for the MFM observation in air. On the other hand, the FM detection technique offers a very high sensitivity because of the high Q factor.This repot describes the MFM technique to take a magnetic image steadily in UHV. We observed the surface of a magnetic material with MFM technique in UHV, and compared the slope detection technique, the phase detection technique using phase variation of cantilever vibration, and the FM detection technique.

Sign in / Sign up

Export Citation Format

Share Document