Failure Analysis and New Design of a Thin-Film Silicon-on-Insulator Power Metal-Oxide-Semiconductor Field-Effect Transistor Based on Emission Microscopy and 2-Dimensional Device Simulation

1995 ◽  
Vol 34 (Part 1, No. 4A) ◽  
pp. 1790-1795
Author(s):  
Satoshi Matsumoto ◽  
Takao Fukumitsu ◽  
Il-Jung Kim ◽  
Tatsuo Sakai ◽  
Toshiaki Yachi
Keyword(s):  
Thin Film ◽  
Failure Analysis ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Device Simulation ◽  
Metal Oxide Semiconductor ◽  
Silicon On Insulator ◽  
Oxide Semiconductor ◽  
Effect Transistor ◽  
Emission Microscopy

Effects of buried oxide stress on thin-film silicon-on-insulator metal–oxide–semiconductor field-effect transistor

1998 ◽  
Vol 72 (6) ◽  
pp. 677-679 ◽  
Author(s):  
Jong-Wook Lee ◽  
Myung-Hee Nam ◽  
Jeong-Hee Oh ◽  
Ji-Woon Yang ◽  
Won-Chang Lee ◽  
...  
Keyword(s):  
Thin Film ◽  
Metal Oxide ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Metal Oxide Semiconductor ◽  
Silicon On Insulator ◽  
Oxide Semiconductor ◽  
Buried Oxide ◽  
Oxide Stress ◽  
Effect Transistor

scholarly journals Quantum transport in a nanosize silicon-on-insulator metal-oxide-semiconductor field-effect transistor

2003 ◽  
Vol 93 (2) ◽  
pp. 1230-1240 ◽  
Author(s):  
M. D. Croitoru ◽  
V. N. Gladilin ◽  
V. M. Fomin ◽  
J. T. Devreese ◽  
W. Magnus ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Quantum Transport ◽  
Field Effect ◽  
Field Effect Transistor ◽  
Metal Oxide Semiconductor ◽  
Silicon On Insulator ◽  
Oxide Semiconductor ◽  
Effect Transistor
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