PH3Ion Shower Implantation and Rapid Thermal Anneal with Oxide Capping and Its Application to Source and Drain Formation of a Fully Depleted Silicon-on-Insulator Metal Oxide Semiconductor Field Effect Transistor
2004 ◽
Vol 43
(10)
◽
pp. 6943-6947
◽
2004 ◽
Vol 43
(4B)
◽
pp. 2166-2169
◽
2009 ◽
Vol 48
(11)
◽
pp. 114503
◽
2008 ◽
Vol 25
(8)
◽
pp. 3048-3051
◽
2003 ◽
Vol 20
(5)
◽
pp. 767-769
◽
2018 ◽
Vol 57
(4S)
◽
pp. 04FD19
◽