Analysis of p–n Junction Profiles of Polycrystalline Silicon Thin-Film Solar Cells by Electron-Beam-Induced Current Technique

2006 ◽  
Vol 45 (4A) ◽  
pp. 2441-2446 ◽  
Author(s):  
Tsutomu Yamazaki ◽  
Yukiharu Uraoka ◽  
Takashi Fuyuki
Keyword(s):  
Thin Film ◽  
Electron Beam ◽  
Solar Cells ◽  
Polycrystalline Silicon ◽  
Thin Film Solar Cells ◽  
Induced Current ◽  
Silicon Thin Film ◽  
Current Technique ◽  
Electron Beam Induced Current

scholarly journals Identifying the Electronic Properties of Grain Boundaries in CdTe Thin-film Solar Cells Using Electron Backscatter Diffraction and Electron Beam Induced Current Techniques

2013 ◽  
Vol 19 (S2) ◽  
pp. 718-719
Author(s):  
J. Poplawsky ◽  
C. Li ◽  
N. Paudel ◽  
Y. Yan ◽  
S. Pennycook
Keyword(s):  
Thin Film ◽  
Electron Beam ◽  
Solar Cells ◽  
Electron Backscatter Diffraction ◽  
Thin Film Solar Cells ◽  
Cdte Thin Film ◽  
Induced Current ◽  
Electron Backscatter ◽  
Electron Beam Induced Current ◽  
Backscatter Diffraction

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

A two-dimensional modeling of the fine-grained polycrystalline silicon thin-film solar cells

2002 ◽  
Vol 403-404 ◽  
pp. 258-262 ◽  
Author(s):  
E Christoffel ◽  
M Rusu ◽  
A Zerga ◽  
S Bourdais ◽  
S Noël ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Polycrystalline Silicon ◽  
Thin Film Solar Cells ◽  
Two Dimensional ◽  
Silicon Thin Film ◽  
Fine Grained ◽  
Dimensional Modeling

Chemical speciation at buried interfaces in high-temperature processed polycrystalline silicon thin-film solar cells on ZnO:Al

2013 ◽  
Vol 113 (4) ◽  
pp. 044519 ◽  
Author(s):  
Christiane Becker ◽  
Marcel Pagels ◽  
Carolin Zachäus ◽  
Beatrix Pollakowski ◽  
Burkhard Beckhoff ◽  
...  
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
High Temperature ◽  
Polycrystalline Silicon ◽  
Chemical Speciation ◽  
Thin Film Solar Cells ◽  
Silicon Thin Film ◽  
Buried Interfaces
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