Extraction Technique of Trap Density at Grain Boundaries in Polycrystalline-Silicon Thin-Film Transistors with Device Simulation

2007 ◽  
Vol 46 (3B) ◽  
pp. 1308-1311 ◽  
Author(s):  
Kiyoshi Harada ◽  
Takuto Yoshino ◽  
Tohru Yasuhara ◽  
Mutsumi Kimura ◽  
Daisuke Abe ◽  
...  
Keyword(s):  
Thin Film ◽  
Grain Boundaries ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Device Simulation ◽  
Trap Density ◽  
Extraction Technique ◽  
Silicon Thin Film

scholarly journals Device Simulation of Polycrystalline-Silicon Thin-Film Transistors with Trap States at Front and Back Oxide Interfaces

2004 ◽  
Vol 58 (9) ◽  
pp. 1242-1247
Author(s):  
Mutsumi Kimura ◽  
Tohru Yasuhara ◽  
Kiyoshi Harada ◽  
Daisuke Abe ◽  
Satoshi Inoue ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Device Simulation ◽  
Trap States ◽  
Silicon Thin Film ◽  
Oxide Interfaces

Carrier transport across grain boundaries in polycrystalline silicon thin film transistors

2016 ◽  
Vol 31 (1) ◽  
pp. 87-92 ◽  
Author(s):  
Yong Chen ◽  
Shuang Zhang ◽  
Zhang Li ◽  
Hanhua Huang ◽  
Wenfeng Wang ◽  
...  
Keyword(s):  
Thin Film ◽  
Grain Boundaries ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Carrier Transport ◽  
Silicon Thin Film

Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

2000 ◽  
Vol 76 (17) ◽  
pp. 2442-2444 ◽  
Author(s):  
C. T. Angelis ◽  
C. A. Dimitriadis ◽  
F. V. Farmakis ◽  
J. Brini ◽  
G. Kamarinos ◽  
...  
Keyword(s):  
Thin Film ◽  
Excimer Laser ◽  
Threshold Voltage ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film

Dynamic-Gate-Stress-Induced Degradation in Bridged-Grain Polycrystalline Silicon Thin-Film Transistors

2016 ◽  
Vol 63 (10) ◽  
pp. 3964-3970 ◽  
Author(s):  
Meng Zhang ◽  
Zhihe Xia ◽  
Wei Zhou ◽  
Rongsheng Chen ◽  
Man Wong ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Silicon Thin Film
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