Effects of grain boundaries on performance and hot-carrier reliability of excimer-laser annealed polycrystalline silicon thin film transistors

Journal of Applied Physics ◽

10.1063/1.1699504 ◽

2004 ◽

Vol 95 (10) ◽

pp. 5788-5794 ◽

Author(s):

Tien-Fu Chen ◽

Ching-Fa Yeh ◽

Jen-Chung Lou

Keyword(s):

Thin Film ◽

Grain Boundaries ◽

Excimer Laser ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

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Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors

Microelectronics Reliability ◽

10.1016/j.microrel.2004.07.082 ◽

2004 ◽

Vol 44 (9-11) ◽

pp. 1631-1636 ◽

Keyword(s):

Thin Film ◽

Excimer Laser ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

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Influences of Grain Boundaries on Temperature Dependence of Device Characteristics and on Hot Carrier Effects in Low-Temperature Polycrystalline Silicon Thin Film Transistors Containing Large Grains

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.1312 ◽

2007 ◽

Vol 46 (3B) ◽

pp. 1312-1317

Author(s):

Toshiaki Tsuchiya ◽

Takafumi Miura ◽

Tsubasa Yamai ◽

Genshiro Kawachi ◽

Masakiyo Matsumura

Keyword(s):

Thin Film ◽

Low Temperature ◽

Temperature Dependence ◽

Grain Boundaries ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Effects

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Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors

Applied Physics Letters ◽

10.1063/1.126370 ◽

2000 ◽

Vol 76 (17) ◽

pp. 2442-2444 ◽

Author(s):

C. T. Angelis ◽

C. A. Dimitriadis ◽

F. V. Farmakis ◽

J. Brini ◽

G. Kamarinos ◽

...

Keyword(s):

Thin Film ◽

Excimer Laser ◽

Threshold Voltage ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

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Evaluation of trap states at front and back oxide interfaces and grain boundaries using electrical characteristic analysis and device simulation of polycrystalline silicon thin-film transistors

Electronics and Communications in Japan (Part II Electronics) ◽

10.1002/ecjb.20124 ◽

2005 ◽

Vol 88 (2) ◽

pp. 1-10 ◽

Author(s):

Mutsumi Kimura

Keyword(s):

Thin Film ◽

Grain Boundaries ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Electrical Characteristic ◽

Device Simulation ◽

Trap States ◽

Characteristic Analysis ◽

Silicon Thin Film ◽

Oxide Interfaces

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Hot-Carrier Degradation and Electric Field and Electron Concentration near Drain Junction in Low-Temperature N-Channel Single Drain and Lightly Doped Drain Polycrystalline Silicon Thin Film Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.46.1322 ◽

2007 ◽

Vol 46 (3B) ◽

pp. 1322-1327 ◽

Author(s):

Gen Usami ◽

Yukisato Nogami ◽

Toshihisa Yajima ◽

Masahiro Yamagata ◽

Toshifumi Satoh ◽

...

Keyword(s):

Thin Film ◽

Low Temperature ◽

Electric Field ◽

Electron Concentration ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Hot Carrier ◽

Lightly Doped Drain ◽

Hot Carrier Degradation

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Hot-Carrier Effects in Short Channel (L= 1.5 µm) p-Type Polycrystalline Silicon Thin-Film Transistors

Japanese Journal of Applied Physics ◽

10.7567/jjap.51.024103 ◽

2012 ◽

Vol 51 (2R) ◽

pp. 024103

Author(s):

Sung-Hwan Choi ◽

Yeon-Gon Mo ◽

Hye-Dong Kim ◽

Min-Koo Han

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film ◽

Short Channel ◽

Hot Carrier ◽

Hot Carrier Effects ◽

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Leakage current of offset gate p- and n-channel excimer laser annealed polycrystalline silicon thin-film transistors

Solid-State Electronics ◽

10.1016/s0038-1101(01)00002-8 ◽

2001 ◽

Vol 45 (2) ◽

pp. 365-368 ◽

Author(s):

C.A. Dimitriadis ◽

G. Kamarinos ◽

J. Brini

Keyword(s):

Thin Film ◽

Leakage Current ◽

Excimer Laser ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

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Optimization of crystallization energy density for excimer laser annealed polycrystalline silicon thin film transistors

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict.2016.7998677 ◽

2016 ◽

Author(s):

Dongyu Qi ◽

Dongli Zhang ◽

Mingxiang Wang ◽

Jianwen Li

Keyword(s):

Thin Film ◽

Energy Density ◽

Excimer Laser ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Silicon Thin Film

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Analysis of Hot-Carrier Effects, 'Kink' Effect and Low Frequency Noise in Polycrystalline Silicon Thin-Film Transistors

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.51-52.585 ◽

1996 ◽

Vol 51-52 ◽

pp. 585-596 ◽

Author(s):

G. Fortunato

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Low Frequency ◽

Frequency Noise ◽

Low Frequency Noise ◽

Silicon Thin Film ◽

Hot Carrier ◽

Kink Effect ◽

Hot Carrier Effects

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Effective density-of-states distribution of polycrystalline silicon thin-film transistors under hot-carrier degradation

Journal of Applied Physics ◽

10.1063/1.2777804 ◽

2007 ◽

Vol 102 (5) ◽

pp. 054508 ◽

Author(s):

Ming-Hsien Lee ◽

Kai-Hsiang Chang ◽

Horng-Chih Lin

Keyword(s):

Thin Film ◽

Density Of States ◽

Thin Film Transistors ◽

Polycrystalline Silicon ◽

Effective Density ◽

Silicon Thin Film ◽

Hot Carrier ◽

Hot Carrier Degradation

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