Work Function Measurement of Modified W(100) Surface with Transition Metal by Photoemission Electron Microscopy

2008 ◽  
Vol 47 (3) ◽  
pp. 1713-1716 ◽  
Author(s):  
Yusuke Nakano ◽  
Hideaki Nakane ◽  
Hiroshi Adachi
2002 ◽  
Vol 09 (01) ◽  
pp. 313-318
Author(s):  
JOSELITO LABIS ◽  
AKIHIKO OHI ◽  
CHIHIRO KAMEZAWA ◽  
TOSHINORI FUJIKI ◽  
KENICHI YOSHIDA ◽  
...  

The Si L2,3 and C K soft X-ray emission spectra of the interface of the Ti(50 nm)/4H-SiC(substrate) system, thermally annealed from 800°C to 1000°C and characterized by soft X-ray emission spectroscopy (SXES), revealed the formation of a reacted region composed of silicides with Ti 5 Si 3 as the majority formed species and carbides in TiC-like bonding. Also, the photoemission electron microscopy (PEEM) imaging of Ti(10 nm) film on 3C-SiC surface during in situ heat treatment showed the formation of island structures (in ring clusters) at ~ 800°C.


Author(s):  
G. F. Rempfer

In photoelectron microscopy (PEM), also called photoemission electron microscopy (PEEM), the image is formed by electrons which have been liberated from the specimen by ultraviolet light. The electrons are accelerated by an electric field before being imaged by an electron lens system. The specimen is supported on a planar electrode (or the electrode itself may be the specimen), and the accelerating field is applied between the specimen, which serves as the cathode, and an anode. The accelerating field is essentially uniform except for microfields near the surface of the specimen and a diverging field near the anode aperture. The uniform field forms a virtual image of the specimen (virtual specimen) at unit lateral magnification, approximately twice as far from the anode as is the specimen. The diverging field at the anode aperture in turn forms a virtual image of the virtual specimen at magnification 2/3, at a distance from the anode of 4/3 the specimen distance. This demagnified virtual image is the object for the objective stage of the lens system.


Author(s):  
H.H. Rotermund

Chemical reactions at a surface will in most cases show a measurable influence on the work function of the clean surface. This change of the work function δφ can be used to image the local distributions of the investigated reaction,.if one of the reacting partners is adsorbed at the surface in form of islands of sufficient size (Δ>0.2μm). These can than be visualized via a photoemission electron microscope (PEEM). Changes of φ as low as 2 meV give already a change in the total intensity of a PEEM picture. To achieve reasonable contrast for an image several 10 meV of δφ are needed. Dynamic processes as surface diffusion of CO or O on single crystal surfaces as well as reaction / diffusion fronts have been observed in real time and space.


2017 ◽  
Vol 23 (S1) ◽  
pp. 1504-1505
Author(s):  
Taisuke Ohta ◽  
Morgann Berg ◽  
Kunttal Keyshar ◽  
Jason M. Kephart ◽  
Thomas E. Beechem ◽  
...  

Nano Letters ◽  
2017 ◽  
Vol 17 (2) ◽  
pp. 1034-1041 ◽  
Author(s):  
Hongxuan Guo ◽  
Evgheni Strelcov ◽  
Alexander Yulaev ◽  
Jian Wang ◽  
Narayana Appathurai ◽  
...  

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