Impact of Mechanical Stress on Hot-Carrier Lifetime and Time-Dependent Dielectric Breakdown in Downscaled Complimentary Metal–Oxide–Semiconductor
2009 ◽
Vol 48
(2)
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pp. 021206
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2008 ◽
Vol 600-603
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pp. 791-794
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2002 ◽
Vol 41
(Part 1, No. 1)
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pp. 47-53
2014 ◽
Vol 778-780
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pp. 611-614
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2003 ◽
Vol 42
(Part 1, No. 2A)
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pp. 409-413
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2015 ◽
Vol 821-823
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pp. 177-180
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