XI.The determination of the atomic scattering power for X-rays from powders of gold, silver, and aluminium for Cu Kα radiation

Author(s):  
J. Brentano
Keyword(s):  
X Rays ◽  

Calculations of f , the atomic scattering factor of an element for X-rays, have hitherto been made on the assumption that the value of f for a given value of sin θ/λ is independent of wave-length. This assumption is only justified when the frequency of the X-rays is much greater than the characteristic frequency of any of the energy levels in the scattering atom. This condition is realised when a hard radiation such as Mo Kα is used in order to investigate crystals containing only light elements, such as aluminium. Under these conditions it has been found that absolute determination of f made experimentally give results in excellent agreement with theory. In many investigations, however, we are dealing with an entirely different set of conditions. For example, investigations of alloys are usually carried out with Cr, Fe or Cu radiation. Often the alloys contain Cr, Mn, Fe, Co, Ni, Cu or Zn, and the K absorption edge for each of these elements is near the wave-length of the radiation employed. Under these circumstances the conditions postulated by the simple theory no longer hold. Dispersion terms must now be introduced into the scattering formula, and we get an effect which may in some degree be compared with the anomalous dispersion of light.


Crystals of the native metals gold, silver and copper have been found which exhibit twinning on an octahedral plane of the spinel type. Metallurgists have described as twins the banded structures which are of very frequent occurrence in these metals when prepared commercially, as they resemble lamellar twinning in calcite and felspar very closely. A few quantitative measurements have been made to determine the relationship between such bands in a metallic crystal; but the value of the results depends on the correct determination of the orientation of the respective parts, and this can only be done by means of X-rays or by indirect methods such as the measurement of slip-bands, etching-pits, etc., which are not always trustworthy. McKeehan measured some structures resembling twins in nearly pure iron by obtaining reflections from the deeply etched surface of a wire mounted in a goniometer. He concluded that the crystals were twins in a crystallographic sense, the twin plane being of the form {211} and the twin axis of the form [111].


Author(s):  
J N Chapman ◽  
W A P Nicholson

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.


2021 ◽  
Vol 11 (15) ◽  
pp. 6948
Author(s):  
Gabriele Cervino ◽  
Sergio Sambataro ◽  
Chiara Stumpo ◽  
Salvatore Bocchieri ◽  
Fausto Murabito ◽  
...  

The aim of this study is to demonstrate the use and the effectiveness of cephalometry and golden proportions analysis of the face in planning prosthetic treatments in totally edentulous patients. In order to apply this method, latero-lateral and posterior-anterior X-rays must be performed in addition to the common procedure. Two main concerns for totally edentulous patients are the establishment of the vertical dimension and the new position of the occlusal plane. The divine proportion analysis was carried out by the use of a golden divider. The prosthetic protocol was divided into three steps and a case was selected for better understanding. Referring to the golden relations, if the distance from the chin to the wing of the nose is 1.0, the distance from the nose to eye is 0.618. This proportion is useful and effective in determining the correct prosthetic vertical dimension. The incisal margin of the lower incisor must be positioned between Point A (A) and protuberance menti (Pm) according to the gold ratio 0.618 of the total height A-Pm. Posteriorly the occlusal plane must be placed 2 mm below the divine occlusal plane (traced from the incisal margin of lower incisors to Xi point). A prosthesis made in accordance with cephalometric parameters and divine proportions of the face helps to improve the patient’s aesthetics, function and social personality.


1918 ◽  
Vol 14 (54) ◽  
pp. 33-33
Author(s):  
P. T. Weeks
Keyword(s):  

Crystals ◽  
2018 ◽  
Vol 8 (7) ◽  
pp. 273 ◽  
Author(s):  
José Brandão-Neto ◽  
Leonardo Bernasconi

Macromolecular crystallography at cryogenic temperatures has so far provided the majority of the experimental evidence that underpins the determination of the atomic structures of proteins and other biomolecular assemblies by means of single crystal X-ray diffraction experiments. One of the core limitations of the current methods is that crystal samples degrade as they are subject to X-rays, and two broad groups of effects are observed: global and specific damage. While the currently successful approach is to operate outside the range where global damage is observed, specific damage is not well understood and may lead to poor interpretation of the chemistry and biology of the system under study. In this work, we present a phenomenological model in which specific damage is understood as the result of a single process, the steady excitation of crystal electrons caused by X-ray absorption, which acts as a trigger for the bulk effects that manifest themselves in the form of global damage and obscure the interpretation of chemical information from XFEL and synchrotron structural research.


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