Analysis of Surface Carbon Contamination on Phosphated Zinc Surfaces by Scanning Kelvin Probe Measurements

Journal of The Electrochemical Society ◽

10.1149/1.1838334 ◽

1998 ◽

Vol 145 (3) ◽

pp. L39-L42 ◽

Author(s):

A. Nazarov ◽

D. Thierry

Keyword(s):

Kelvin Probe ◽

Carbon Contamination ◽

Surface Carbon ◽

Scanning Kelvin Probe ◽

Probe Measurements

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Scanning Kelvin probe measurements on As-doped CdTe solar cells

Semiconductor Science and Technology ◽

10.1088/0268-1242/28/10/105024 ◽

2013 ◽

Vol 28 (10) ◽

pp. 105024 ◽

Author(s):

W S M Brooks ◽

S J C Irvine ◽

D M Taylor

Keyword(s):

Solar Cells ◽

Kelvin Probe ◽

Cdte Solar Cells ◽

Scanning Kelvin Probe ◽

Probe Measurements

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In situ infrared spectroscopic and scanning Kelvin probe measurements of water and ion transport at polymer/metal interfaces

Electrochimica Acta ◽

10.1016/j.electacta.2005.09.024 ◽

2006 ◽

Vol 51 (16) ◽

pp. 3303-3315 ◽

Author(s):

K. Wapner ◽

M. Stratmann ◽

G. Grundmeier

Keyword(s):

Ion Transport ◽

Kelvin Probe ◽

Scanning Kelvin Probe ◽

Infrared Spectroscopic ◽

Polymer Metal ◽

Metal Interfaces ◽

Water And Ion Transport ◽

Probe Measurements

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Scanning Kelvin Probe Measurements near Salt Particles on Zinc and Iron in High Humidity

CORROSION ◽

10.5006/1.3280635 ◽

2005 ◽

Vol 61 (3) ◽

pp. 264-271 ◽

Author(s):

J. Wang ◽

Y. Wang

Keyword(s):

High Humidity ◽

Kelvin Probe ◽

Scanning Kelvin Probe ◽

Probe Measurements

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Scanning Kelvin Probe Measurements of the Stability of Adhesive/Metal Interfaces in Corrosive Environments

Advanced Engineering Materials ◽

10.1002/adem.200300579 ◽

2004 ◽

Vol 6 (3) ◽

pp. 163-167 ◽

Author(s):

K. Wapner ◽

G. Grundmeier

Keyword(s):

Kelvin Probe ◽

Scanning Kelvin Probe ◽

Metal Interfaces ◽

The Stability ◽

Corrosive Environments ◽

Probe Measurements

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Suitability of Various Materials for Probes in Scanning Kelvin Probe Measurements

physica status solidi (a) ◽

10.1002/pssa.201700952 ◽

2017 ◽

Vol 215 (15) ◽

pp. 1700952 ◽

Author(s):

Silvia Huber ◽

Mariusz Wicinski ◽

Achim Walter Hassel

Keyword(s):

Kelvin Probe ◽

Scanning Kelvin Probe ◽

Probe Measurements

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Direct observation of contact potential distributions of wafer-bonded p-GaAs/n-GaN and p-GaAs/n-Si by scanning Kelvin probe force microscopy

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/abc02a ◽

2020 ◽

Vol 59 (11) ◽

pp. 115502

Author(s):

Zhiwei Xing ◽

Wenxian Yang ◽

Yukun Zhao ◽

Junhua Long ◽

Xuefei Li ◽

...

Keyword(s):

Direct Observation ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Contact Potential ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Quantitative calibration of the relationship between Volta potential measured by scanning Kelvin probe force microscope (SKPFM) and hydrogen concentration

Electrochimica Acta ◽

10.1016/j.electacta.2020.137422 ◽

2021 ◽

Vol 366 ◽

pp. 137422

Author(s):

Zhaoxiang Ma ◽

Xilin Xiong ◽

Lin Chen ◽

Yanjing Su

Keyword(s):

Hydrogen Concentration ◽

Kelvin Probe ◽

Scanning Kelvin Probe ◽

Volta Potential ◽

The Relationship

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Imaging Local Trap Formation in Conjugated Polymer Solar Cells: A Comparison of Time-Resolved Electrostatic Force Microscopy and Scanning Kelvin Probe Imaging

The Journal of Physical Chemistry C ◽

10.1021/jp1056607 ◽

2010 ◽

Vol 114 (48) ◽

pp. 20672-20677 ◽

Author(s):

Obadiah G. Reid ◽

Glennis E. Rayermann ◽

David C. Coffey ◽

David S. Ginger

Keyword(s):

Solar Cells ◽

Conjugated Polymer ◽

Electrostatic Force ◽

Polymer Solar Cells ◽

Electrostatic Force Microscopy ◽

Kelvin Probe ◽

Time Resolved ◽

Force Microscopy ◽

Trap Formation ◽

Scanning Kelvin Probe

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Scanning Kelvin probe force microscopy as a means of predicting the electrochemical characteristics of the surface of a modified AA4xxx/AA3xxx (Al alloys) brazing sheet

Electrochimica Acta ◽

10.1016/j.electacta.2012.10.051 ◽

2013 ◽

Vol 88 ◽

pp. 330-339 ◽

Author(s):

F. Norouzi Afshar ◽

J.H.W. de Wit ◽

H. Terryn ◽

J.M.C. Mol

Keyword(s):

Al Alloys ◽

Kelvin Probe Force Microscopy ◽

Electrochemical Characteristics ◽

Kelvin Probe ◽

Force Microscopy ◽

Scanning Kelvin Probe

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Photoreduction Altered Work Function of Au–TiO2 Nanoparticles Measured by Scanning Kelvin Probe Microscopy

Journal of Nanoscience and Nanotechnology ◽

10.1166/jnn.2013.7932 ◽

2013 ◽

Vol 13 (12) ◽

pp. 8217-8223 ◽

Author(s):

Arun S. Patel ◽

Avesh Kumar ◽

T. Mohanty

Keyword(s):

Work Function ◽

Kelvin Probe ◽

Probe Microscopy ◽

Kelvin Probe Microscopy ◽

Scanning Kelvin Probe

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