Characteristics of Zinc Oxide Films Grown on Sapphire Substrates Using High-Energy H2O Generated by a Catalytic Reaction on Platinum Nanoparticles

2019 ◽  
Vol 19 (2) ◽  
pp. 843-853 ◽  
Author(s):  
Kuo-Yi Yen ◽  
Kuang-Pi Liu ◽  
Yen-Ting Lin ◽  
Jyh-Rong Gong ◽  
Kuen-Yau Tsai ◽  
...  

Author(s):  
T. A. Emma ◽  
M. P. Singh

Optical quality zinc oxide films have been characterized using reflection electron diffraction (RED), replication electron microscopy (REM), scanning electron microscopy (SEM), and X-ray diffraction (XRD). Significant microstructural differences were observed between rf sputtered films and planar magnetron rf sputtered films. Piezoelectric materials have been attractive for applications to integrated optics since they provide an active medium for signal processing. Among the desirable physical characteristics of sputtered ZnO films used for this and related applications are a highly preferred crystallographic texture and relatively smooth surfaces. It has been found that these characteristics are very sensitive to the type and condition of the substrate and to the several sputtering parameters: target, rf power, gas composition and substrate temperature.


2009 ◽  
Vol 129 (11) ◽  
pp. 1981-1984
Author(s):  
Yuki Ueno ◽  
Takanori Aoki ◽  
Akio Suzuki ◽  
Tatsuhiko Matsushita ◽  
Masahiro Okuda

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