(Invited) Epitaxial Thin Films of Solid-State Battery Material

AbstractEpitaxial thin films of Mn3O4 and ZnMn2O4 have been grown hydrothermally on (100) and (111) MgAl2O4 substrates. Film growth was characterized as a function of pH, concentration, and time and thin film X-ray diffraction revealed that the resulting films are an epitaxial continuation of the underlying spinel lattice. Reduction of these films to MnO occurred topotactically and in the case of ZnMn2O4, resulted in mesopores aligned along the <100> directions. As the films maintain an epitaxial relationship with the substrate, the mesopores are aligned macroscopically within a single crystal lattice.

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TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100167561 ◽

1996 ◽

Vol 54 ◽

pp. 1020-1021

Author(s):

F. Ma ◽

S. Vivekanand ◽

K. Barmak ◽

C. Michaelsen

Keyword(s):

Thin Films ◽

Solid State ◽

Stoichiometric Composition ◽

Analytical Electron Microscopy ◽

Grain Structure ◽

Solid State Reactions ◽

Multilayer Thin Films ◽

X Ray Diffraction ◽

X Ray ◽

Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

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Surface Coordination Interphase Stabilizes Solid‐State Battery

Angewandte Chemie International Edition ◽

10.1002/anie.202108050 ◽

2021 ◽

Author(s):

Ya-Nan Yang ◽

Fang-Ling Jiang ◽

Yi-Qiu Li ◽

Zhao-Xi Wang ◽

Tao Zhang

Keyword(s):

Solid State ◽

Solid State Battery

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Solid State NMR Spectroscopy a Valuable Technique for Structural Insights of Advanced Thin Film Materials: A Review

Nanomaterials ◽

10.3390/nano11061494 ◽

2021 ◽

Vol 11 (6) ◽

pp. 1494

Author(s):

Mustapha El Hariri El Nokab ◽

Khaled O. Sebakhy

Keyword(s):

Thin Film ◽

Thin Films ◽

Solid State ◽

Solid State Nmr ◽

Pulse Sequences ◽

3D Structure ◽

Spectroscopic Techniques ◽

Film Research ◽

Versatile Technique ◽

Work Done

Solid-state NMR has proven to be a versatile technique for studying the chemical structure, 3D structure and dynamics of all sorts of chemical compounds. In nanotechnology and particularly in thin films, the study of chemical modification, molecular packing, end chain motion, distance determination and solvent-matrix interactions is essential for controlling the final product properties and applications. Despite its atomic-level research capabilities and recent technical advancements, solid-state NMR is still lacking behind other spectroscopic techniques in the field of thin films due to the underestimation of NMR capabilities, availability, great variety of nuclei and pulse sequences, lack of sensitivity for quadrupole nuclei and time-consuming experiments. This article will comprehensively and critically review the work done by solid-state NMR on different types of thin films and the most advanced NMR strategies, which are beyond conventional, and the hardware design used to overcome the technical issues in thin-film research.

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