D072 A New Area Detector for High-Speed and High-Sensitivity X-ray Diffraction Analysis—Invited

2005 ◽  
Vol 20 (2) ◽  
pp. 185-185
Author(s):  
T. Taguchi
Keyword(s):  
Diffraction Analysis ◽  
High Speed ◽  
High Sensitivity ◽  
X Ray Diffraction ◽  
X Ray ◽  
Area Detector

A new position sensitive area detector for high-speed and high-sensitivity X-ray diffraction analysis

2006 ◽  
Vol 21 (2) ◽  
pp. 97-101 ◽  
Author(s):  
Takeyoshi Taguchi
Keyword(s):  
High Speed ◽  
Scintillation Counter ◽  
High Sensitivity ◽  
Dislocation Network ◽  
Sensitive Area ◽  
X Ray Diffraction ◽  
Scanning Calorimetry ◽  
X Ray ◽  
Area Detector ◽  
Position Sensitive

A state-of-art semiconductor technology-based position sensitive area detector, namely D/teX-25, has recently been developed for high-speed and high-sensitivity X-ray diffraction (XRD) analysis of materials. X-ray powder diffraction intensities obtained by a D/teX-25 detector were found to over 50 times higher than those by a conventional scintillation counter. A D/teX-25 detector mounted on a conventional 2 kW XRD system has been used to collect ultrafast XRD data with scanning speeds up to 160°2θ per minute. Ultrahigh-speed XRD is particularly useful for time-resolved dynamical and in-situ studies. A D/teX-25 detector was successfully used on a Rigaku XRD differential scanning calorimetry (DSC) system for simultaneous measurements of XRD and DSC data under controlled temperature and humidity conditions. This has made possible the study of complex and rapid phase transformations of pharmaceutical terfenadine. The D/teX-25 area detector has also been used for recording two-dimensional XRD patterns showing the particle-size effects on α-quartz powder intensities and to obtain digital X-ray topographic images of a complex dislocation network in a Si wafer.

Rapid small-angle X-ray diffraction of a tonically contracting molluscan smooth muscle recorded with imaging plates

1989 ◽  
Vol 22 (1) ◽  
pp. 72-74 ◽  
Author(s):  
Y. Tajima ◽  
K. Okada ◽  
O. Yoshida ◽  
T. Seto ◽  
Y. Amemiya
Keyword(s):  
Small Angle ◽  
Structural Changes ◽  
High Sensitivity ◽  
Imaging Plate ◽  
Layer Line ◽  
X Ray Diffraction ◽  
Thin Filaments ◽  
X Ray ◽  
Area Detector ◽  
Diffraction Patterns

Small-angle X-ray diffraction patterns from the anterior byssus retractor muscles of Mytilus edulis contracting tonically in response to stimulation with acetylcholine were recorded in a 30 s exposure with synchrotron radiation and a high-sensitivity X-ray area detector called an imaging plate. The 190 Å layer line from the thin filaments increased in intensity with increase in tonic tension up to 6 x 104 kg m−2. Above this value, the layer-line intensity remained almost constant and comparable to that for a contracting skeletal muscle, indicating that the same structural changes of the thin filaments occur in both muscles.

A system for collection and on-line integration of X-ray diffraction data from a multiwire area detector

1987 ◽  
Vol 20 (3) ◽  
pp. 235-242 ◽  
Author(s):  
M. Blum ◽  
P. Metcalf ◽  
S. C. Harrison ◽  
D. C. Wiley
Keyword(s):  
Diffraction Data ◽  
High Speed ◽  
X Ray Diffraction ◽  
Quality Of Data ◽  
X Ray ◽  
Camera Control ◽  
Area Detector ◽  
C Programming ◽  
On Line ◽  
Integrated Intensities

A system for collecting and measuring X-ray diffraction data from protein crystals has been developed for a multiwire area detector. Computer programs run concurrently on two microcomputers, which collect and reduce detector data to integrated intensities. The self-contained system consists of an X-ray area detector, a rotation/oscillation camera, and two microcomputers connected by a high-speed Ethernet network. One microcomputer is dedicated to operation of the detector, control of the camera, and storage of the raw data. The second microcomputer automatically integrates the data as they are collected and allows the user to monitor the quality of data as they are processed. The integration programs are written in Fortran 77 and have been designed to be portable. Additional programs for crystal alignment, detector and camera control, and graphics are written in the C programming language. A description of the system, some characteristics of the detector, and the results of data collection are presented.

High-Speed Retained Austenite Analysis with an Energy Dispersive X-Ray Diffraction Technique

1973 ◽  
Vol 17 ◽  
pp. 124-138 ◽  
Author(s):  
A. P. Voskamp
Keyword(s):  
Diffraction Analysis ◽  
Retained Austenite ◽  
High Speed ◽  
Conventional Technique ◽  
Energy Dispersive ◽  
Correction Factors ◽  
X Ray Diffraction ◽  
Time Saving ◽  
X Ray

SummaryA time saving method has been applied for the determination of retained austenite.The method involved is based on the approach of energy dispersive X-ray diffraction analysis. With this approach, polychromatic radiation from the X-ray tube is used and diffraction maxima will occur at a fixed angle 2θ in as many wavelengths or energies as “d“ values are present.Giessen and Gordon published the first application of this method to powder diffraction analysis in 1968 for the identification of crystal structures. As the determination of retained austenite is a quantitative type of analysis, based upon identification of the crystal structure, the new approach should also be applicable in principle.With almost 100 samples of unknown austenite content, experiments have been carried out both with the conventional and the energy dispersive X-ray diffraction technique. The results obtained are closely comparable and the retained austenite values together with the errors are shown.For these measurements, experiments have been carried out with the energy dispersive technique to determine the relation between the known concentration of retained austenite in a number of standards and the intensity correction factors (R). The results obtained from these experiments have shown good reproducibility of the intensity correction factors.Using this technique, a five-fold reduction in analysis time is possible over the conventional technique with no reduction in accuracy.

scholarly journals Determination of crystal size distribution by two-dimensional X-ray diffraction

2014 ◽  
Vol 70 (a1) ◽  
pp. C1131-C1131
Author(s):  
Alejandro Rodriguez-Navarro ◽  
Krzysztof Kudłacz
Keyword(s):  
Size Distribution ◽  
Crystal Size ◽  
High Sensitivity ◽  
Crystal Size Distribution ◽  
Polycrystalline Materials ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Area Detector ◽  
Diffraction Patterns

Polycrystalline materials properties and behaviour are ultimately determined by their crystallinity, phase composition and microstructure (i.e., crystal size, preferential orientation). Two-dimensional (2D) diffraction patterns collected with an area detector (i.e., CDD), available in modern X-ray diffractometers, contain detailed information about all these important material characteristics. Furthermore, recent advances in detector technologies permits the collection of high resolution diffraction patterns in which the microstructure of the material can be directly imaged. If the size of beam relative to the crystal size in the sample is adequately choosen, the diffraction pattern produced will have spotty rings in which the spots are the diffracted images of individual grains. The resolution of the image is mainly dependent on the characteristics of the X-ray beam (i.e., diameter, angular divergence), which can be modulated by X-ray optics, sample to detector distance, the pixel size of the detector and the sharpness of the point spread function. From these patterns, the crystal size distribution of different crystalline phases present in the sample can be independently determined using specialized software capable of extracting and combining the information contained in these patterns. This technique is applicable to materials with crystal sizes ranging from submicron to mm sizes and is complementary to techniques based on peak profile analyses (i.e., Scherrer method) which are applicable only to nanocrystalline materials. Finally, given the high sensitivity of current detectors, crystal size evolution can be followed in real-time to study important transformation processes such as crystallization, annealing, etc. The use of 2D X-ray diffraction as applied to microstructure characterization will be illustrated through several examples.

High speed X-ray diffraction analysis

1991 ◽  
Vol 24 (2) ◽  
pp. 119
Author(s):  
SociétéTransvalor
Keyword(s):  
Diffraction Analysis ◽  
High Speed ◽  
X Ray Diffraction ◽  
X Ray

Ten-Vertex Polyhedral Monocarbaborane Chemistry. The Novel High-Yield Formation of the Ten-Vertex closo Compound [6-(PMe2Ph)-closo-1-CB9H9] from the Thermolysis of [8,8-(PMe2Ph)2-nido-8,7-PtCB9H11]

1993 ◽  
Vol 58 (12) ◽  
pp. 2924-2935 ◽  
Author(s):  
Jane H. Jones ◽  
Bohumil Štíbr ◽  
John D. Kennedy ◽  
Mark Thornton-Pett
Keyword(s):  
Nmr Spectroscopy ◽  
Diffraction Analysis ◽  
High Yield ◽  
Monoclinic Space Group ◽  
The Novel ◽  
X Ray Diffraction ◽  
Metal Centre ◽  
X Ray ◽  
Yield Formation ◽  
Boiling Toluene

Thermolysis of [8,8-(PMe2Ph)2-nido-8,7-PtCB9H11] in boiling toluene solution results in an elimination of the platinum centre and cluster closure to give the ten-vertex closo species [6-(PMe2Ph)-closo-1-CB9H9] in 85% yield as a colourles air stable solid. The product is characterized by NMR spectroscopy and single-crystal X-ray diffraction analysis. Crystals (from hexane-dichloromethane) are monoclinic, space group P21/c, with a = 903.20(9), b = 1 481.86(11), c = 2 320.0(2) pm, β = 97.860(7)° and Z = 8, and the structure has been refined to R(Rw) = 0.045(0.051) for 3 281 observed reflections with Fo > 2.0σ(Fo). The clean high-yield elimination of a metal centre from a polyhedral metallaborane or metallaheteroborane species is very rare.

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