Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plate

2000 ◽  
Vol 33 (5) ◽  
pp. 1241-1245 ◽  
Author(s):  
A. Fujiwara ◽  
K. Ishii ◽  
T. Watanuki ◽  
H. Suematsu ◽  
H. Nakao ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Performance Test ◽  
High Pressures ◽  
Dynamic Range ◽  
Short Exposure ◽  
Imaging Plate ◽  
High Quality ◽  
Short Exposure Time ◽  
X Ray ◽  
Powder Diffractometer

A synchrotron radiation X-ray powder diffractometer for samples of very small amount has been developed to collect high-quality diffraction patterns under extreme conditions,i.e.at low temperature and/or high pressure. A new cylindrical imaging plate (CIP) is used as a detector, in addition to a conventional flat-type imaging plate (FIP). By using the CIP system, the diffraction data in a diffraction angle range −44 ≤ 2θ ≤ 122° are collected with a dynamic range of about 106. The alignment of the diffractometer, measurement and analysis are automatically operated by a workstation. A performance test shows that the CIP system has spatial resolution of about 0.07° with a dynamic range of 106. The diffraction pattern of a standard sample of Si measured by the CIP system has high quality; the refinement of the structure reachesRw= 3.68% even in the case of a small amount of sample (about 2 µg) and a short exposure time (60 s). Examples of experiments at low temperatures under ambient and high pressures are also presented.

X-Ray Analysis of Stress in a Localized Area by Use of Imaging Plate

1991 ◽  
Vol 35 (A) ◽  
pp. 537-543 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Shin'ichi Ohya
Keyword(s):  
Short Exposure ◽  
Imaging Plate ◽  
Image Analyzer ◽  
Single Exposure ◽  
Short Exposure Time ◽  
X Ray ◽  
Area Detector ◽  
Lattice Strains ◽  
Exposure Method

AbstractFor determination of stress in a localized area, we combined a modified single exposure technique and the imaging plate, which is an x-ray digital area detector. With the, single exposure method, stress value is obtained from lattice strains in two directions with a single incident x-ray beam directed at an oblique angle. However, since diffraction data around a whole Debye-Scherrer ring was used in this study, a stress value can be accurately determined in comparison with the single exposure method. We observed the DS ring by use of the imaging plate with requiring only a short exposure time. Lattice strains in many directions on a DS ring were measured by an image analyzer connected to a computer; we verified the effectiveness of this method.

Direct Observation of Diffraction Arcs from Nanoscale Precipitates in Steels by Highly Brilliant and Focused Synchrotron Radiation Beam and Imaging Plate

1994 ◽  
Vol 332 ◽  
Author(s):  
Yasuo Takagi ◽  
Yoshitaka Okitsu ◽  
Toshiyasu Ukena
Keyword(s):  
Synchrotron Radiation ◽  
Direct Observation ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Imaging Plate ◽  
Synchrotron Radiation Beam ◽  
Radiation Beam ◽  
X Ray ◽  
The Matrix ◽  
First Time

ABSTRACTDirect observation of diffraction arcs by X-ray from nanoscale precipitates in steels has become possible for the first time by using a highly brilliant and focused synchrotron radiation beam at BL3A of Photon Factory, and also by using an “imaging plate”, a two dimensional X-ray detector which has a wide dynamic range and high sensitivity. For examples, most of the diffraction arcs from ε-Cu precipitates (∼200 Å in diameter and ∼1 at. % in concentration) in Cu-added steels were observed. The method can apply to nondestructive and in-situ observation of creation and growth processes of the precipitates which has close relationships to various physical properties of the matrix steels.

A double-radius Gandolfi X-ray camera for the generation of powder-like diffractograms of small single crystals, using an imaging plate detector

2002 ◽  
Vol 35 (1) ◽  
pp. 13-16 ◽  
Author(s):  
H. H. Otto ◽  
W. Hofmann ◽  
K. Schröder
Keyword(s):  
Single Crystals ◽  
Dynamic Imaging ◽  
Short Exposure ◽  
Imaging Plate ◽  
Data Sets ◽  
Short Exposure Time ◽  
X Ray ◽  
Diffraction Patterns ◽  
Non Destructive ◽  
Plate System

This is a report on the construction and the main features of an X-ray camera following the Debye–Scherrer geometry, combined with a sample mounting and rotation device for single crystals as first suggested by Gandolfi. Doubling of the camera radius and replacing of the wet-film technology by a highly dynamic imaging plate system allows well resolved digital diffraction patterns to be recorded within a short exposure time. Sophisticated calibration, correction and evaluation possibilities are supported by suitable software. Further optional improvements, such as the evacuation of the camera, the adaptation of totally reflecting collimators for an almost parallel primary X-ray beam and a built-in instead of an external imaging plate readout device, will further improve the resolution and peak to background ratio. The simple and versatile apparatus is indispensable for the fast and non-destructive identification of unique mineralogical or technical micro-samples in the form of single-crystal pieces. Initial representative data sets attest to the accuracy, efficiency and sensitivity of the method presented.

Construction of a Multimode High Resolution X-Ray Powder Diffractometer and its Perfomance

1991 ◽  
Vol 35 (A) ◽  
pp. 375-381
Author(s):  
Masayasu Kurahashi ◽  
Kazumasa Honda ◽  
Midori Goto ◽  
Yu Inari ◽  
Chuji Katayama
Keyword(s):  
High Resolution ◽  
Organic Compound ◽  
Imaging Plate ◽  
Large Radius ◽  
X Rays ◽  
Parallel Beam ◽  
High Quality ◽  
X Ray ◽  
Powder Diffractometer ◽  
Beam Mode

AbstractRecently some of the above authors determined the structure of an unsolved organic compound employing X-rays from a Synchrotron, an Imaging Plate, and a large radius camera. It would be more desirable if the high quality powder diffaction data could be obtained by a diffractometer or a camera of laboratory use. Therefore a multimode X-ray powder diffractometer which can be used for various experimental geometries such as Bragg-Brentano mode, Guinier mode and parallel beam mode was constructed in order to find the highest resolution geometry. In this paper wc present the results of the measurements employing these three modes.

Short Exposure Time Characteristics Of X-Ray Generators

1983 ◽  
Author(s):  
Bruce A. Horn ◽  
Kim C. Luk ◽  
David M. Thomasson ◽  
Charles E. Finney
Keyword(s):  
Exposure Time ◽  
Short Exposure ◽  
Short Exposure Time ◽  
X Ray

scholarly journals HiSPoD: a program for high-speed polychromatic X-ray diffraction experiments and data analysis on polycrystalline samples

2016 ◽  
Vol 23 (4) ◽  
pp. 1046-1053 ◽  
Author(s):  
Tao Sun ◽  
Kamel Fezzaa
Keyword(s):  
Diffraction Data ◽  
High Speed ◽  
Short Pulse ◽  
Frame Rate ◽  
Short Exposure ◽  
X Rays ◽  
X Ray Diffraction ◽  
Short Exposure Time ◽  
X Ray ◽  
Structure Information

A high-speed X-ray diffraction technique was recently developed at the 32-ID-B beamline of the Advanced Photon Source for studying highly dynamic, yet non-repeatable and irreversible, materials processes. In experiments, the microstructure evolution in a single material event is probed by recording a series of diffraction patterns with extremely short exposure time and high frame rate. Owing to the limited flux in a short pulse and the polychromatic nature of the incident X-rays, analysis of the diffraction data is challenging. Here,HiSPoD, a stand-alone Matlab-based software for analyzing the polychromatic X-ray diffraction data from polycrystalline samples, is described. WithHiSPoD, researchers are able to perform diffraction peak indexing, extraction of one-dimensional intensity profiles by integrating a two-dimensional diffraction pattern, and, more importantly, quantitative numerical simulations to obtain precise sample structure information.

scholarly journals Pixel detectors for diffraction-limited storage rings

2014 ◽  
Vol 21 (5) ◽  
pp. 1006-1010 ◽  
Author(s):  
Peter Denes ◽  
Bernd Schmitt
Keyword(s):  
Synchrotron Radiation ◽  
Storage Ring ◽  
Dynamic Range ◽  
State Of The Art ◽  
Storage Rings ◽  
X Rays ◽  
X Ray ◽  
Current State ◽  
Pixel Detectors ◽  
Radiation Sources

Dramatic advances in synchrotron radiation sources produce ever-brighter beams of X-rays, but those advances can only be used if there is a corresponding improvement in X-ray detectors. With the advent of storage ring sources capable of being diffraction-limited (down to a certain wavelength), advances in detector speed, dynamic range and functionality is required. While many of these improvements in detector capabilities are being pursued now, the orders-of-magnitude increases in brightness of diffraction-limited storage ring sources will require challenging non-incremental advances in detectors. This article summarizes the current state of the art, developments underway worldwide, and challenges that diffraction-limited storage ring sources present for detectors.

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