Use of a Two-Dimensional, Position Sensitive Detector for Collecting Pole Figures

1992 ◽  
Vol 36 ◽  
pp. 641-647 ◽  
Author(s):  
Kingsley L. Smith ◽  
Richard B. Ortega

Conventional pole figure instruments consist of a scintillation detector mounted on a 4-circle goniometer operating under computer control. A few instruments make use of a linear PSD detector, which allows collecting data for multiple pole figures sinmltaneously. A PSD does not reduce the required data collection time for the primary pole figure; however, it does save time by eliminating the need to recollect multiple pole figure data. By using a 2D “area” detector, one can simultaneously collect multiple pole figures and reduce the data collection time for the primary pole figure, such an area detector pole figure processing package, GADDS v2, was developed at Siemens and will be discussed.

2008 ◽  
Vol 23 (2) ◽  
pp. 87-91 ◽  
Author(s):  
Anthony C. Rizzie ◽  
Thomas R. Watkins ◽  
E. Andrew Payzant

A practical description of the mathematics required to implement the hexagonal grid and spiral trace pole figure data collection schemes is presented. Applying the concepts of stereographic and equal area projections with geometry, spreadsheets were created to calculate the angular settings of the goniometer. Using the generated settings, the hexagonal grid and spiral trace schemes were programmed into the existing X-ray software and employed to collect data for a sample of aluminum foil. The resulting (111) pole figures were similar to those collected with the conventional 5°χ×5°ϕ grid. The hexagonal grid has been shown by others to reduce the number of data points and time needed to complete a pole figure, while providing equal area sampling. Although not optimized, the spiral method was also investigated as another alternative to the 5°χ×5°ϕ grid.


1994 ◽  
Vol 38 ◽  
pp. 511-516
Author(s):  
B. A. Squires ◽  
K. L. Smith

AbstractWith the increased use of composite materials, it has become increasingly important to perform analysis that quantifies the amount of crystal lographic orientation. In polymers fibers and films the orientation is used to predict the physical properties, such as strength. To determine the orientation it is first necessary to collect a pole figure on a specific reflection. With the conventional powder diffiactometer equipped with an Eulerian cradle, the data collection procedure often lakes a few hours. Additional time is involved for separate background measurements, which are collected at 2θ positions away from the peak. Also, the intensity from these samples is usually weak, requiring increased data collection time to improve counting statistics.Using an area detector decreases the data collection time significantly, because the background experiments are performed simultaneously. We can collect the entire pole figure on both polymer fibers and films in less than one hour using a series of “frames.” The pole figure is determined by integrating over 2θ regions in each frame. For fibers the rules developed by Stein are used to calculate the Hermans orientation factors. For films, the rules are generalized to make them more suitable for biaxial orientation, and the White-Spniieli biaxial orientation factors are reported.


2003 ◽  
Vol 18 (2) ◽  
pp. 99-102 ◽  
Author(s):  
Kurt Helming ◽  
Mike Lyubchenko ◽  
Bob He ◽  
Uwe Preckwinkel

Advances in X-ray texture solutions require new methods and descriptions for the texture analysis process, e.g., when using general area detector diffraction systems. A new method is presented that defines a general pole figure resolution and provides the possibility to optimize strategies for efficient pole figure data collection. Application of the new method improves resolution and (!) speed. New software enables simultaneous monitoring of pole and detector space. This allows a fundamentally better understanding of the collected information, e.g., in situations where peaks overlap or high backgrounds compromise data quality.


2005 ◽  
Vol 495-497 ◽  
pp. 307-312 ◽  
Author(s):  
D.I. Nikolayev ◽  
T.A. Lychagina ◽  
A.V. Nikishin ◽  
V.V. Yudin

The objective of the present work is to study of errors on measured pole figures of hexagonal materials. We used neutron time-of-flight (TOF) technique for texture measurements and obtained spectra for estimating of error values of measured pole figures. Peak profile analysis of an each individual spectrum allows gain pole figure value itself and the corresponding error at each pole figure point as well. Such results could be obtained for measurements on stationary source of radiation with the usage of a position sensitive detector.


1985 ◽  
Vol 38 (3) ◽  
pp. 337 ◽  
Author(s):  
BP Schoenborn ◽  
AM Saxena ◽  
M Stamm ◽  
G Dimmler ◽  
V Radeka

An intermediate resolution neutron spectrometer for collecting diffraction data with the range Q = 0�01-3�0 � has been built for analysing the structural organization of membranes, polymers and other molecular aggregates. This spectrometer has a position-sensitive detector with a capability for time-resolved data collection which may be used to study conformational changes in dynamical systems. A double multilayer monochromator assembly is used to monochromate neutrons. Operating wavelehgths of the spectrometer will be from 2 to 5 �, and the wavelength bandwidth (??/?) can be adjusted within the 1%-8% range.


1981 ◽  
Vol 25 ◽  
pp. 315-324 ◽  
Author(s):  
Herbert E. Göbel

AbstractA strictly focussing Guinier diffractometer using a linear position-sensitive proportional counter (PSPC) to detect the diffracted x-rays is described. The data collection time for a complete pattern can so be reduced to minutes Instead of hours as it used to be in conventional film- or counter-Guinier systems. The PSPC collects all diffracted x-rays over several degrees of 2 Theta in parallel and composes the full pattern by a continuous scan over the whole 2 Theta range. This principle was described in Adv. In X-Ray Anal. Vol. 22, 255 ff and 24, 123 ff. for Bragg-Brentano diffractometers.


Author(s):  
D. Prella ◽  
F. Cámara

AbstractIn order to check for the accuracy of X-ray diffracted data collected with an area-detector diffractometer (FAST-Nonius), we have carried out several data collections on a good-quality pyrope crystal (space group


2015 ◽  
Vol 719-720 ◽  
pp. 580-583
Author(s):  
Xin Wen Duan ◽  
Ye Sun

This paper introduces a kind of measuring system based on two-dimensional position sensitive detector PSD and single-chip signal processing, and have discussed the key technology. Two-dimensional position sensitive detector (2 D-PSD) is a kind of testing device of light spot position information and the output signal is a kind of current signal related to the location information. PSD output signal processing circuits are usually made by the I/V conversion circuit ,the addition, the subtraction and division arithmetic circuit. System can quickly, accurately and easily realize the position measurement, with a simple implementation, low power consumption, fast response, etc, It can be applied to many remote laser center positioning measurement and general industrial control occasions.


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