scholarly journals Fault Sample Generation for Virtual Testability Demonstration Test Subject to Minimal Maintenance and Scheduled Replacement

2015 ◽  
Vol 2015 ◽  
pp. 1-8 ◽  
Author(s):  
Yong Zhang ◽  
Jing Qiu ◽  
Guanjun Liu ◽  
Zhiao Zhao

Virtual testability demonstration test brings new requirements to the fault sample generation. First, fault occurrence process is described by stochastic process theory. It is discussed that fault occurrence process subject to minimal repair is nonhomogeneous Poisson process (NHPP). Second, the interarrival time distribution function of the next fault event is proposed and three typical kinds of parameterized NHPP are discussed. Third, the procedure of fault sample generation is put forward with the assumptions of minimal maintenance and scheduled replacement. The fault modes and their occurrence time subject to specified conditions and time period can be obtained. Finally, an antenna driving subsystem in automatic pointing and tracking platform is taken as a case to illustrate the proposed method. Results indicate that both the size and structure of the fault samples generated by the proposed method are reasonable and effective. The proposed method can be applied to virtual testability demonstration test well.

1981 ◽  
Vol 18 (01) ◽  
pp. 190-203 ◽  
Author(s):  
Guy Latouche

A queueing system with exponential service and correlated arrivals is analysed. Each interarrival time is exponentially distributed. The parameter of the interarrival time distribution depends on the parameter for the preceding arrival, according to a Markov chain. The parameters of the interarrival time distributions are chosen to be equal to a common value plus a factor ofε, where ε is a small number. Successive arrivals are then weakly correlated. The stability condition is found and it is shown that the system has a stationary probability vector of matrix-geometric form. Furthermore, it is shown that the stationary probabilities for the number of customers in the system, are analytic functions ofε, for sufficiently smallε, and depend more on the variability in the interarrival time distribution, than on the correlations.


2005 ◽  
Vol 42 (02) ◽  
pp. 478-490
Author(s):  
De-An Wu ◽  
Hideaki Takagi

We consider single-server queues with exponentially distributed service times, in which the arrival process is governed by a semi-Markov process (SMP). Two service disciplines, processor sharing (PS) and random service (RS), are investigated. We note that the sojourn time distribution of a type-lcustomer who, upon his arrival, meetskcustomers already present in the SMP/M/1/PS queue is identical to the waiting time distribution of a type-lcustomer who, upon his arrival, meetsk+1 customers already present in the SMP/M/1/RS queue. Two sets of system equations, one for the joint transform of the sojourn time and queue size distributions in the SMP/M/1/PS queue, and the other for the joint transform of the waiting time and queue size distributions in the SMP/M/1/RS queue, are derived. Using these equations, the mean sojourn time in the SMP/M/1/PS queue and the mean waiting time in the SMP/M/1/RS queue are obtained. We also consider a special case of the SMP in which the interarrival time distribution is determined only by the type of the customer who has most recently arrived. Numerical examples are also presented.


Author(s):  
BERMAWI P. ISKANDAR ◽  
HIROAKI SANDOH

This study discusses an opportunity-based age replacement policy for a system which has a warranty period (0, S]. When the system fails at its age x≤S, a minimal repair is performed. If an opportunity occurs to the system at its age x for S<x<T, we take the opportunity with probability p to preventively replace the system, while we conduct a corrective replacement when it fails on (S, T). Finally if its age reaches T, we execute a preventive replacement. Under this replacement policy, the design variable is T. For the case where opportunities occur according to a Poisson process, a long-run average cost of this policy is formulated under a general failure time distribution. It is, then, shown that one of the sufficient conditions where a unique finite optimal T* exists is that the failure time distribution is IFR (Increasing Failure Rate). Numerical examples are also presented for the Weibull failure time distribution.


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