scholarly journals Fine Lines in a Three Dimensional Interconnect

1984 ◽  
Vol 11 (2) ◽  
pp. 109-115
Author(s):  
J. A. Scarlett

The techniques for the generation of fine lines on rigid and flexible printed circuit boards are reviewed, and it is shown how the tracking on the interconnect can be made to match the requirements of chip carriers, TAB chips or beam leaded or wire bonded chips directly mounted.The use of fine line techniques on planar substrates can be adapted to provide a low cost, high density interconnect which offers a truly three dimensional connection capability without the use of a “back wiring panel”. Such a three dimensional interconnect can offer opportunities for improvement in the removal of heat from high dissipation chips, thus offering significantly increased reliability.

2004 ◽  
Vol 833 ◽  
Author(s):  
Mikael Lindeberg ◽  
Hanna Yousef ◽  
Erik Öjefors ◽  
Anders Rydberg ◽  
Klas Hjort

ABSTRACTBy combining ion track technology with ordinary low-resolution printed circuitboard lithography it is possible at low cost to create high aspect ratios via connectors, as solid plugs or consisting of bundles of sub-micron connector wires at a small total cross-section.Ion track enabled microwave circuits in flexible printed circuit boards are suggested to be used in applications like inductors, ferromagnetic resonance microwave filters, circulators and magnetoresistive sensors. In this paper we demonstrate this technology with integrated printed circuitboard devices in two different flexible polyimide-based foils (Espandex and Kapton HN), using the ultra-high-density vias and the sub-micron wires.


2009 ◽  
Vol 85 (6) ◽  
pp. 341-350 ◽  
Author(s):  
Jong-Bum Lee ◽  
Ja-Myeong Koo ◽  
Jong-Woong Kim ◽  
Bo-In Noh ◽  
Jong-Gun Lee ◽  
...  

2014 ◽  
Vol 2014 (1) ◽  
pp. 000444-000447 ◽  
Author(s):  
Yoshio Nishimura ◽  
Hirohisa Narahashi ◽  
Shigeo Nakamura ◽  
Tadahiko Yokota

Printed circuit boards manufactured by a semi-additive process are widely used for packaging substrates. Along with increasing demands of downsizing electronic devices with high functionality, packaging substrates installed with semiconductors in such devices are strongly required to be miniaturized with high density of circuit wirings. We report our insulation build-up materials and processes for advanced packages with fine line/space and high reliability. The insulation materials we developed show low coefficient of thermal expansion (CTE), low dielectric loss tangent and good thinner insulation reliability. They can produce fine line and space (FLS) under 10μm pitch by a semi-additive process.


Author(s):  
Jian Zhong ◽  
Ping Yang ◽  
Jian-ping Li ◽  
Hai-bo Sun ◽  
Quayle Chen ◽  
...  

The paper mainly presented mechanical test and failure analysis methods to reliability study of a new FPCB (Flexible Printed Circuit Boards). Mechanical tests include flexural test, tensile test and flexural fatigue and ductility test. As to simulation analysis, the stress distributions of FPCB under bending and tensile conditions were gained by simulations. Through in-depth analysis of the testing results, the mechanical reliability of FPCB was known detailed. The research provides an approach to improve FPCB performance.


2008 ◽  
Vol 47 (5) ◽  
pp. 4300-4304 ◽  
Author(s):  
Jong-Bum Lee ◽  
Ja-Myeong Koo ◽  
Soon-Min Hong ◽  
Hyoyoung Shin ◽  
Young-jun Moon ◽  
...  

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