Dual Energy Computed Tomography (DECT) is expected to become a significant tool for voxel-based detection of hazardous materials in airport baggage screening. The traditional approach to DECT imaging involves collecting the projection data using two different X-ray spectra and then
decomposing the data thus collected into line integrals of two independent characterizations of the material properties. Typically, one of these characterizations involves the effective atomic number (Zeff) of the materials. However, with the X-ray spectral energies typically used
for DECT imaging, the current best-practice approaches for dualenergy decomposition yield Zeff values whose accuracy range is limited to only a subset of the periodic-table elements, more specifically to (Z < 30). Although this estimation can be improved by using a system-independent
ρe — Ze (SIRZ) space, the SIRZ transformation does not efficiently model the polychromatic nature of the X-ray spectra typically used in physical CT scanners. In this paper, we present a new decomposition method, AdaSIRZ, that corrects this shortcoming by adapting
the SIRZ decomposition to the entire spectrum of an X-ray source. The method reformulates the X-ray attenuation equations as direct functions of (ρe, Ze) and solves for the coefficients using bounded nonlinear least-squares optimization. Performance comparison of
AdaSIRZ with other Zeff estimation methods on different sets of real DECT images shows that AdaSIRZ provides a higher output accuracy for Zeff image reconstructions for a wider range of object materials.
Determination of metal atoms neibouring in the atomic number and a research tool for X-ray diffraction experiment with very small crystal.
