Fabrication and Characterization of Twin Poly-Si Thin Film Transistors EEPROM with a Nitride Charge Trapping Layer
2011 ◽
Vol 11
(12)
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pp. 10419-10423
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2005 ◽
Vol 14
(5)
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pp. 1167-1177
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Keyword(s):
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2010 ◽
Vol 28
(4)
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pp. 873-878
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