Fabrication and Characterization of Twin Poly-Si Thin Film Transistors EEPROM with a Nitride Charge Trapping Layer

2011 ◽  
Vol 11 (12) ◽  
pp. 10419-10423 ◽  
Author(s):  
Min-Feng Hung ◽  
Yung-Chun Wu ◽  
Ji-Hong Chiang ◽  
Jiang-Hung Chen ◽  
Lun-Chun Chen
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