Electrical Characterization of Charge Polarity in AlF3 Anti-Reflection Layers for Complementary Metal Oxide Semiconductor Image Sensors

2018 ◽  
Vol 18 (9) ◽  
pp. 6005-6009
Author(s):  
Younghwan Hyeon ◽  
Pyungho Choi ◽  
Sangsub Kim ◽  
Minsoo Kim ◽  
Jeonghyun Lee ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Electrical Characterization ◽  
Complementary Metal Oxide Semiconductor ◽  
Image Sensors ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor

Characterization of High-Performance Polycrystalline Silicon Complementary Metal–Oxide–Semiconductor Circuits

2007 ◽  
Vol 46 (1) ◽  
pp. 51-55 ◽  
Author(s):  
Genshiro Kawachi ◽  
Yoshiaki Nakazaki ◽  
Hiroyuki Ogawa ◽  
Masayuki Jyumonji ◽  
Noritaka Akita ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Polycrystalline Silicon ◽  
High Performance ◽  
Complementary Metal Oxide Semiconductor ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Circuits

Electrical Characterization of GaN Metal Oxide Semiconductor Diode Using Sc[sub 2]O[sub 3] as the Gate Oxide

2002 ◽  
Vol 5 (7) ◽  
pp. G51 ◽  
Author(s):  
R. Mehandru ◽  
B. P. Gila ◽  
J. Kim ◽  
J. W. Johnson ◽  
K. P. Lee ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Electrical Characterization ◽  
Gate Oxide ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor ◽  
Semiconductor Diode

Electrical characterization of deoxyribonucleic acid hybridization in metal-oxide-semiconductor-like structures

2012 ◽  
Vol 101 (9) ◽  
pp. 093703 ◽  
Author(s):  
S. Libertino ◽  
G. Cannella ◽  
V. Aiello ◽  
A. Busacca ◽  
S. Lombardo
Keyword(s):  
Metal Oxide ◽  
Deoxyribonucleic Acid ◽  
Electrical Characterization ◽  
Metal Oxide Semiconductor ◽  
Oxide Semiconductor
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