X-ray powder diffraction with emphasis on qualitative and quantitative analysis in industrial mineralogy

2011 ◽  
pp. 35-76 ◽  
Author(s):  
D.L. Bish ◽  
M. Plötze
Keyword(s):  
Quantitative Analysis ◽  
Powder Diffraction ◽  
Qualitative And Quantitative Analysis ◽  
X Ray ◽  
Qualitative And Quantitative

X-Ray Fluorescence in Cotton Modification Research

1964 ◽  
Vol 8 ◽  
pp. 456-461
Author(s):  
Donald Mitcham ◽  
Biagio Piccolo ◽  
Verne W. Tripp ◽  
Robert T. O’Connor
Keyword(s):  
Quantitative Analysis ◽  
Cotton Textile ◽  
Qualitative And Quantitative Analysis ◽  
X Ray ◽  
Textile Materials ◽  
Qualitative And Quantitative ◽  
Chemically Modified ◽  
Elapsed Time

AbstractThe application of X-ray fluorescence to the qualitative and quantitative analysis of chemically modified cotton textile materials is described. The scope and flexibility of the technique have permitted the determination of more than 20 elements with, greatly reduced elapsed time compared with the corresponding spectroscopic or wet methods. Precautions to be observed in preparing standards are discussed. Results of the analysis of typical modifications and their significance in the development of cottons for specific uses are described.

Qualitative and Quantitative Analysis of Stacking Disorder in α-and β-SiC by X-ray Diffraction and Structure Modeling

1995 ◽  
Vol 410 ◽  
Author(s):  
Bogdan Palosz ◽  
Svetlana Stel'makh ◽  
Stanislaw Gierlotka
Keyword(s):  
Quantitative Analysis ◽  
Model Parameters ◽  
Qualitative And Quantitative Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Qualitative And Quantitative ◽  
Poisson Function ◽  
Diffraction Patterns ◽  
Computer Generation ◽  
Stacking Disorder

ABSTRACTA method of analysis of disordering in α- and β-SiC polycrystals by numerical modeling, and a simulation of X-ray diffraction profiles are presented. The diffraction patterns of nonperiodic structures were simulated for models of 2000 layer fragments of the structure. Computer generation of the models was based on the Poisson function describing the size distribution of the domains of basic polytypes and faults. The models were quantified by a set of input probability parameters describing relative frequencies of the occurrence of the domains of polytypes and faults. Implementation of a correlation parameter that characterizes coherence of sequential domains of a given polytype assures a good reproducibility of the simulated diffraction profiles obtained for the same set of the model parameters. Based on this method, a quantitative analysis of disordering in polycrystals of SiC annealed in the temperature range 1100–2200 °C was performed.

Influence of Goniometric Arrangement and Absorption in Qualitative and Quantitative Analysis of Powders by X-Ray Diffractometry

1959 ◽  
Vol 3 ◽  
pp. 337-348 ◽  
Author(s):  
J. Leroux ◽  
M. Mahmud
Keyword(s):  
Quantitative Analysis ◽  
Large Range ◽  
Volume Fraction ◽  
Polycrystalline Material ◽  
Bragg Angle ◽  
Qualitative And Quantitative Analysis ◽  
X Ray ◽  
Qualitative And Quantitative ◽  
Factors Influencing ◽  
Conventional Sample

AbstractA theoretical approach of some factors influencing the intensity diffracted by a polycrystalline material at a definite Bragg angle has been confirmed by experimental data obtained with a high-angle Norelco diffractometer. The factors mainly considered are the focusing arrangement of the goniometer which delineates the geometric shape of the volume fraction of the sample being irradiated and the absorption of the latter.Tests have been performed (a) with quartz mixed in samples covering a large range of absorption coefficients, (b) with two different K radiations using copper and molybdenum targets, (c) with three different angles of beam divergence of 1, ½, and ¼°, respectively, and (d) with the sample packed and leveled in a copper grid with openings of about 350 μ. As this test with copper grids was to demonstrate that each opening was acting like a volume of sample irradiated by a beam of extremely small divergence (0.1°), it also shows that more accuracy in the measurement of the exact Bragg angle can be reached in these conditions as compared to that obtained with conventional sample holders.A general equation, suitable for qualitative and quantitative analysis when these factors have to be taken into consideration, is proposed.

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