Magnetic Storage System Materials

Author(s):  
Yip-Wah Chung ◽  
Zunde Yang
1984 ◽  
pp. 123-132 ◽  
Author(s):  
R. I. Schermer ◽  
M. H. Barron ◽  
H. J. Boenig ◽  
R. R. Brown ◽  
A. L. Criscuolo ◽  
...  

2020 ◽  
Vol 10 (15) ◽  
pp. 5295 ◽  
Author(s):  
Seongkwon Jeong ◽  
Jaejin Lee

A bit-patterned media recording (BPMR) system is a type of ultrahigh-capacity magnetic storage system that can extend to an areal density of 1 terabit per square inch or higher. However, because the space between islands in the down- and cross-track directions is reduced to extend the areal density, the effect of two-dimensional interference is increased. However, using a staggered array, which is one of the possible island distributions for BPMR, helps to decrease intertrack interference. A 7/10 modulation code for a staggered BPMR is proposed to avoid the effect of two-dimensional interference and provide distance among nonidentical codewords for improving the correcting capability.


2006 ◽  
Vol 42 (10) ◽  
pp. 2477-2479
Author(s):  
H. Yamada ◽  
R. Tsuchiyama ◽  
H. Kikuchi ◽  
T. Shimatsu ◽  
I. Watanabe ◽  
...  

2003 ◽  
Vol 27 (4) ◽  
pp. 265-268 ◽  
Author(s):  
H. Yamada ◽  
T. Shimatsu ◽  
I. Watanabe ◽  
H. Muraoka ◽  
Y. Nakamura

2003 ◽  
Vol 39 (6) ◽  
pp. 3619-3621 ◽  
Author(s):  
H. Yamada ◽  
T. Shimatsu ◽  
I. Watanabe ◽  
H. Muraoka ◽  
Y. Nakamura

Author(s):  
H. Yamada ◽  
R. Tsuchiyama ◽  
H. Kikuchi ◽  
T. Shimatsu ◽  
I. Watanabe ◽  
...  

Author(s):  
Y. Kokubo ◽  
W. H. Hardy ◽  
J. Dance ◽  
K. Jones

A color coded digital image processing is accomplished by using JEM100CX TEM SCAN and ORTEC’s LSI-11 computer based multi-channel analyzer (EEDS-II-System III) for image analysis and display. Color coding of the recorded image enables enhanced visualization of the image using mathematical techniques such as compression, gray scale expansion, gamma-processing, filtering, etc., without subjecting the sample to further electron beam irradiation once images have been stored in the memory.The powerful combination between a scanning electron microscope and computer is starting to be widely used 1) - 4) for the purpose of image processing and particle analysis. Especially, in scanning electron microscopy it is possible to get all information resulting from the interactions between the electron beam and specimen materials, by using different detectors for signals such as secondary electron, backscattered electrons, elastic scattered electrons, inelastic scattered electrons, un-scattered electrons, X-rays, etc., each of which contains specific information arising from their physical origin, study of a wide range of effects becomes possible.


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