Analyses by inductively coupled plasma mass spectrometry of Ba concentrations in water and rock samples. Comparison between isotope dilution and external calibration with or without internal standard

1995 ◽  
Vol 1 (1) ◽  
pp. 283 ◽  
Author(s):  
Remi Freydier ◽  
Bernard Dupre ◽  
Mireille Polve
Keyword(s):  
Mass Spectrometry ◽  
Isotope Dilution ◽  
Inductively Coupled Plasma ◽  
Internal Standard ◽  
External Calibration ◽  
Rock Samples ◽  
Inductively Coupled ◽  
Plasma Mass Spectrometry

Accurate determination of Zn in geological and cosmochemical rock samples by isotope dilution inductively coupled plasma mass spectrometry

2015 ◽  
Vol 30 (2) ◽  
pp. 506-514 ◽  
Author(s):  
Rahat Khan ◽  
Yuta Yokozuka ◽  
Saki Terai ◽  
Naoki Shirai ◽  
Mitsuru Ebihara
Keyword(s):  
Mass Spectrometry ◽  
Isotope Dilution ◽  
Inductively Coupled Plasma ◽  
Accurate Determination ◽  
Rock Samples ◽  
Inductively Coupled ◽  
Icp Ms ◽  
Plasma Mass Spectrometry

Inductively coupled plasma mass spectrometry (ICP-MS) procedures with isotope dilution were established for the accurate determination of trace Zn (in the level of 10−4to 10−5g g−1) in several tens of mg of geological and cosmochemical rock samples.

scholarly journals Isotope analysis of highly enriched “silicon-28” by high-resolution inductively coupled plasma mass spectrometry using an internal standard

2021 ◽  
Vol 25 (2) ◽  
pp. 98-109
Author(s):  
P. A. Otopkova ◽  
◽  
A. M. Potapov ◽  
A. I. Suchkov ◽  
A. D. Bulanov ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Matrix Element ◽  
High Resolution ◽  
Inductively Coupled Plasma ◽  
Internal Standard ◽  
Isotopic Analysis ◽  
Random Component ◽  
Inductively Coupled ◽  
The Matrix ◽  
Plasma Mass Spectrometry

In order to study the isotopic effects in semiconductor materials, single crystals of high chemical and isotopic purity are required. The reliability of the obtained data on the magnitude and the direction of isotopic shifts depends on the accuracy of determining the concentration of all stable isotopes. In the isotopic analysis of enriched “silicon-28” with a high degree of enrichment (> 99.99%), it is necessary to determine the impurities of 29Si and 30Si isotopes at the level of 10-3 ¸ 10-5 at. %. At this concentration level, these isotopes can be considered as impurities. It is difficult to achieve high measurement accuracy with simultaneous registration of the main and “impurity” isotopes in such a wide range of concentrations. The registration of analytical signals of silicon isotopes must be carried out in the solutions with different matrix concentrations. The use of the solutions with the high concentration of the matrix element requires the introduction of corrections for matrix noise and the drift of the instrument sensitivity during the measurement. It is possible to reduce the influence of the irreversible non-spectral interference and sensitivity drift by using the method of internal standardization. The inconsistency of the literature data on the selection criteria for the internal standard required studying the behavior of the signals of the “candidates for the internal standard” for the ELEMENT 2 single-collector high-resolution inductively coupled plasma mass spectrometer on the matrix element concentration and the nature of the solvent, as well as on the solution nebulizing time. Accounting for the irreversible non-spectral matrix noise and instrumental drift in isotopic analysis of enriched “silicon-28” and initial 28SiF4 by inductively coupled plasma mass spectrometry had allowed us to reduce by 3-5 times the random component and by more than an order of magnitude the systematic component of the measurement error in comparison with the external standard method. This made it possible to carry out, with sufficient accuracy, the operational control of the isotopic composition of enriched “silicon-28”, both in the form of silicon tetrafluoride and polycrystalline silicon obtained from it, using a single serial device in the range of isotopic concentrations 0.0001–99.999%.

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