Study of the Defect Structure of Hg1-xCdxTe Films by Ion Milling

AbstractIon milling, as a tool for “stirring” defects in HgCdTe by injecting high concentration of interstitial mercury atoms, was used for studying films grown by liquid phase epitaxy (LPE) on CdZnTe substrates. The films appeared to have very low residual donor concentration (∼1014 cm−3), yet, similar to the material grown by molecular beam epitaxy, contained Te-related neutral defects, which the milling activated electrically. It is shown that ion milling has a stronger effect on HgCdTe defect structure than thermal treatment, and yet eventually brings the material to an “equilibrium” state with defect concentration lower than that after low-temperature annealing.

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Evolution of MBE HgCdTe defect structure studied with ion milling method

EPJ Web of Conferences ◽

10.1051/epjconf/201713301004 ◽

2016 ◽

Vol 133 ◽

pp. 01004

Author(s):

Malgorzata Pociask-Bialy

Keyword(s):

Defect Structure ◽

Ion Milling ◽

Milling Method

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Defects in Nb-Cr-Ti C15 Laves Phase Alloys

Microscopy and Microanalysis ◽

10.1017/s1431927600022807 ◽

1998 ◽

Vol 4 (S2) ◽

pp. 536-537

Author(s):

P. G. Kotula ◽

C.B. Carter ◽

K. C. Chen ◽

D. J. Thoma ◽

F. Chu ◽

...

Keyword(s):

Defect Structure ◽

Laves Phase ◽

Dual Phase ◽

Ion Milling ◽

Two Phase ◽

Arc Melting ◽

Complete Solid Solution ◽

Initial Characterization ◽

Potential Use

Laves-phase intermetallics are of potential use as high-temperature structural materials. NbCr2-based C15-structured alloys are of particular interest for such applications. The effect of Ti alloying on the microstucture and mechanical properties of such alloys has been investigated and it has been shown that Ti can improve the fracture toughness of the monolithic CI 5 Laves phase8 and dual-phase (bcc and CI 5) alloys. In the Nb-Cr-Ti system, there is a complete solid solution between NbCr2 and TiCr2, with a significant range of solubility of the C15 phase and a large two phase, bcc and C15, region. The initial characterization of the defect structure of an alloy of overall composition Nb10Cr75Ti15 is discussed here.Nb10Cr75Ti15 was prepared by arc-melting the high-purity elemental metals followed by annealing at 1400°C for 120 h and then cooling at l°C/min. Specimens were prepared for observation in the TEM by cutting 3 mm discs with a coring saw, followed by dimpling and ion milling.

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Defect structure in near–surface layer of CdHgTe crystals after low–energy Ar ion milling

Materials Science and Engineering B ◽

10.1016/j.mseb.2004.07.010 ◽

2004 ◽

Vol 114-115 ◽

pp. 274-278

Author(s):

L. Dumanski ◽

I. Stefaniuk ◽

I.S. Virt ◽

M. Kuzma

Keyword(s):

Surface Layer ◽

Defect Structure ◽

Low Energy ◽

Ion Milling ◽

Near Surface

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Ion-milling-assisted study of defect structure of acceptor-doped HgCdTe heterostructures grown by molecular beam epitaxy

Semiconductor Science and Technology ◽

10.1088/0268-1242/23/9/095001 ◽

2008 ◽

Vol 23 (9) ◽

pp. 095001 ◽

Cited By ~ 10

Author(s):

M Pociask ◽

I I Izhnin ◽

S A Dvoretsky ◽

N N Mikhailov ◽

Yu G Sidorov ◽

...

Keyword(s):

Molecular Beam Epitaxy ◽

Defect Structure ◽

Molecular Beam ◽

Ion Milling

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High Voltage Electron Microscopy of Ion-Milled Dental Enamel

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100050317 ◽

1974 ◽

Vol 32 ◽

pp. 60-61

Author(s):

L. D. Ackerman ◽

S. H. Y. Wei

Keyword(s):

Electron Microscopy ◽

High Voltage ◽

Third Molar ◽

Polarized Light ◽

Dental Enamel ◽

Longitudinal Section ◽

Ion Milling ◽

High Voltage Electron Microscopy ◽

Voltage Electron ◽

High Voltage Electron

Mature human dental enamel has presented investigators with several difficulties in ultramicrotomy of specimens for electron microscopy due to its high degree of mineralization. This study explores the possibility of combining ion-milling and high voltage electron microscopy as a means of circumventing the problems of ultramicrotomy.A longitudinal section of an extracted human third molar was ground to a thickness of about 30 um and polarized light micrographs were taken. The specimen was attached to a single hole grid and thinned by argon-ion bombardment at 15° incidence while rotating at 15 rpm. The beam current in each of two guns was 50 μA with an accelerating voltage of 4 kV. A 20 nm carbon coating was evaporated onto the specimen to prevent an electron charge from building up during electron microscopy.

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Techniques for Transmission Electron Microscopy of Fiber-Matrix Interfaces in Aluminum Alloy-Boron Composites by Ion Erosio

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100065079 ◽

1971 ◽

Vol 29 ◽

pp. 204-205

Author(s):

G. G. Shaw

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Aluminum Alloy ◽

Electron Beam ◽

Pure Aluminum ◽

Ion Milling ◽

Transmission Electron ◽

Fiber Matrix ◽

Ion Erosion ◽

Row Of Fibers

The morphology and composition of the fiber-matrix interface can best be studied by transmission electron microscopy and electron diffraction. For some composites satisfactory samples can be prepared by electropolishing. For others such as aluminum alloy-boron composites ion erosion is necessary.When one wishes to examine a specimen with the electron beam perpendicular to the fiber, preparation is as follows: A 1/8 in. disk is cut from the sample with a cylindrical tool by spark machining. Thin slices, 5 mils thick, containing one row of fibers, are then, spark-machined from the disk. After spark machining, the slice is carefully polished with diamond paste until the row of fibers is exposed on each side, as shown in Figure 1.In the case where examination is desired with the electron beam parallel to the fiber, preparation is as follows: Experimental composites are usually 50 mils or less in thickness so an auxiliary holder is necessary during ion milling and for easy transfer to the electron microscope. This holder is pure aluminum sheet, 3 mils thick.

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Microtomy of spherical Al2O3 powders

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010007429x ◽

1983 ◽

Vol 41 ◽

pp. 74-75

Author(s):

E.J. Jenkins ◽

D.S. Tucker ◽

J.J. Hren

Keyword(s):

Thin Film ◽

Size Range ◽

Particle Aggregation ◽

Ion Milling ◽

Thin Sections ◽

Α Phase ◽

Convenient Means ◽

Van Der Waals Attraction ◽

Negative Feature ◽

Film Substrate

The size range of mineral and ceramic particles of one to a few microns is awkward to prepare for examination by TEM. Electrons can be transmitted through smaller particles directly and larger particles can be thinned by crushing and dispersion onto a substrate or by embedding in a film followed by ion milling. Attempts at dispersion onto a thin film substrate often result in particle aggregation by van der Waals attraction. In the present work we studied 1-10 μm diameter Al2O3 spheres which were transformed from the amprphous state to the stable α phase.After the appropriate heat treatment, the spherical powders were embedded in as high a density as practicable in a hard EPON, and then microtomed into thin sections. There are several advantages to this method. Obviously, this is a rapid and convenient means to study the microstructure of serial slices. EDS, ELS, and diffraction studies are also considerably more informative. Furthermore, confidence in sampling reliability is considerably enhanced. The major negative feature is some distortion of the microstructure inherent to the microtoming operation; however, this appears to have been surprisingly small. The details of the method and some typical results follow.

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Comparative Microstructures of Ion Milled and Electrochemically Thinned Composite Materials

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100052742 ◽

1974 ◽

Vol 32 ◽

pp. 546-547

Author(s):

R.R. Russell

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Composite Materials ◽

Great Difficulty ◽

Ion Milling ◽

Transmission Electron ◽

Ion Damage ◽

Intermetallic Composite

Transmission electron microscopy of metallic/intermetallic composite materials is most challenging since the microscopist typically has great difficulty preparing specimens with uniform electron thin areas in adjacent phases. The application of ion milling for thinning foils from such materials has been quite effective. Although composite specimens prepared by ion milling have yielded much microstructural information, this technique has some inherent drawbacks such as the possible generation of ion damage near sample surfaces.

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Effects of Ion Beam Milling on Surface Topography

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100070862 ◽

1973 ◽

Vol 31 ◽

pp. 84-85

Author(s):

P.G. Pawar ◽

P. Duhamel ◽

G.W. Monk

Keyword(s):

Surface Topography ◽

Ion Beam ◽

Solid Material ◽

Beam Current ◽

Atomic Mass ◽

Micro Milling ◽

Ion Milling ◽

Controlled Atmospheres ◽

Milling Operations ◽

Sufficient Energy

A beam of ions of mass greater than a few atomic mass units and with sufficient energy can remove atoms from the surface of a solid material at a useful rate. A system used to achieve this purpose under controlled atmospheres is called an ion miliing machine. An ion milling apparatus presently available as IMMI-III with a IMMIAC was used in this investigation. Unless otherwise stated, all the micro milling operations were done with Ar+ at 6kv using a beam current of 100 μA for each of the two guns, with a specimen tilt of 15° from the horizontal plane.It is fairly well established that ion bombardment of the surface of homogeneous materials can produce surface topography which resembles geological erosional features.

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