scholarly journals Normal Force Calibration Method Used for Calibration οf Atomic Force Microscope

2009 ◽  
Vol 116 (Supplement) ◽  
pp. S-78-S-81 ◽  
Author(s):  
M. Ekwińska ◽  
Z. Rymuza
Keyword(s):  
Atomic Force Microscope ◽  
Normal Force ◽  
Calibration Method ◽  
Atomic Force ◽  
Force Calibration

Method for lateral force calibration in atomic force microscope using MEMS microforce sensor

2017 ◽  
Vol 182 ◽  
pp. 1-9 ◽  
Author(s):  
Cezary Dziekoński ◽  
Wojciech Dera ◽  
Dariusz M. Jarząbek
Keyword(s):  
Atomic Force Microscope ◽  
Lateral Force ◽  
Atomic Force ◽  
Force Calibration

Lateral force calibration for atomic force microscope cantilevers using a suspended nanowire

2020 ◽  
Vol 31 (47) ◽  
pp. 475703
Author(s):  
Guangjie Zhang ◽  
Peng Li ◽  
Dawei Wei ◽  
Kui Hu ◽  
Xiaohui Qiu
Keyword(s):  
Atomic Force Microscope ◽  
Lateral Force ◽  
Atomic Force ◽  
Force Calibration

Calibration of normal force in atomic force microscope

2007 ◽  
pp. 505-510 ◽  
Author(s):  
M. Ekwińska ◽  
G. Ekwiński ◽  
Z. Rymuza
Keyword(s):  
Atomic Force Microscope ◽  
Normal Force ◽  
Atomic Force

scholarly journals A direct micropipette-based calibration method for atomic force microscope cantilevers

2009 ◽  
Vol 80 (6) ◽  
pp. 065109 ◽  
Author(s):  
Baoyu Liu ◽  
Yan Yu ◽  
Da-Kang Yao ◽  
Jin-Yu Shao
Keyword(s):  
Atomic Force Microscope ◽  
Calibration Method ◽  
Atomic Force

Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope

2012 ◽  
Vol 83 (2) ◽  
pp. 023707 ◽  
Author(s):  
Sarice S. Barkley ◽  
Zhao Deng ◽  
Richard S. Gates ◽  
Mark G. Reitsma ◽  
Rachel J. Cannara
Keyword(s):  
Atomic Force Microscope ◽  
Lateral Force ◽  
Quantitative Comparison ◽  
Atomic Force ◽  
Force Calibration ◽  
Calibration Techniques
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