In situ force calibration of high force constant atomic force microscope cantilevers

1994 ◽  
Vol 65 (7) ◽  
pp. 2255-2257 ◽  
Author(s):  
D. Scholl ◽  
M. P. Everson ◽  
R. C. Jaklevic
Keyword(s):  
Atomic Force Microscope ◽  
Force Constant ◽  
Atomic Force ◽  
In Situ Force ◽  
Force Calibration

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

scholarly journals In situ observation of streptavidin-biotin binding on an immunoassay well surface using an atomic force microscope

FEBS Letters ◽  
1996 ◽  
Vol 390 (2) ◽  
pp. 161-164 ◽  
Author(s):  
S. Allen ◽  
J. Davies ◽  
A.C. Dawkes ◽  
M.C. Davies ◽  
J.C. Edwards ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
In Situ Observation ◽  
Atomic Force ◽  
Biotin Binding

scholarly journals Atomic force microscope with an adjustable probe direction and piezoresistive cantilevers operated in tapping-mode / Im Tapping-Modus betriebenes Rasterkraftmikroskop mit einstellbarer Antastrichtung und piezoresistiven Cantilevern

2019 ◽  
Vol 86 (s1) ◽  
pp. 12-16
Author(s):  
Janik Schaude ◽  
Julius Albrecht ◽  
Ute Klöpzig ◽  
Andreas C. Gröschl ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Metrological Traceability ◽  
Step Height ◽  
Tapping Mode ◽  
Atomic Force ◽  
In Situ Calibration ◽  
Measuring Machine ◽  
Piezoresistive Cantilevers

AbstractThis article presents a new tilting atomic force microscope (AFM) with an adjustable probe direction and piezoresistive cantilever operated in tapping-mode. The AFM is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The whole setup is integrated into a nano measuring machine (NMM-1) and the metrological traceability of the piezoresistive cantilever is warranted by in situ calibration on the NMM-1. To demonstrate the capabilities of the tilting AFM, measurements were conducted on a step height standard.

scholarly journals Nanopipette/Nanorod-Combined Quartz Tuning Fork–Atomic Force Microscope

Sensors ◽  
2019 ◽  
Vol 19 (8) ◽  
pp. 1794 ◽  
Author(s):  
Sangmin An ◽  
Wonho Jhe
Keyword(s):  
Atomic Force Microscope ◽  
Tuning Fork ◽  
High Sensitivity ◽  
Quartz Tuning Fork ◽  
Force Sensor ◽  
Au Nanoparticle ◽  
Ambient Conditions ◽  
Atomic Force ◽  
In Situ Detection

We introduce a nanopipette/quartz tuning fork (QTF)–atomic force microscope (AFM) for nanolithography and a nanorod/QTF–AFM for nanoscratching with in situ detection of shear dynamics during performance. Capillary-condensed nanoscale water meniscus-mediated and electric field-assisted small-volume liquid ejection and nanolithography in ambient conditions are performed at a low bias voltage (~10 V) via a nanopipette/QTF–AFM. We produce and analyze Au nanoparticle-aggregated nanowire by using nanomeniscus-based particle stacking via a nanopipette/QTF–AFM. In addition, we perform a nanoscratching technique using in situ detection of the mechanical interactions of shear dynamics via a nanorod/QTF–AFM with force sensor capability and high sensitivity.

In Situ Atomic Force Microscope Imaging of Supported Lipid Bilayers

2001 ◽  
Vol 2 (2) ◽  
pp. 105-108 ◽  
Author(s):  
Thomas Kaasgaard ◽  
Chad Leidy ◽  
John Hjort Ipsen ◽  
Ole G. Mouritsen ◽  
Kent Jørgensen
Keyword(s):  
Atomic Force Microscope ◽  
Lipid Bilayers ◽  
Supported Lipid Bilayers ◽  
Atomic Force ◽  
Microscope Imaging

scholarly journals A Correlative Defect Analyzer Combining Glide Test with Atomic Force Microscope

2013 ◽  
Vol 2013 ◽  
pp. 1-8 ◽  
Author(s):  
Jizhong He
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
Optical Imaging ◽  
Hard Disk Drive ◽  
Disk Drive ◽  
Atomic Force ◽  
Typical Data ◽  
Afm Imaging ◽  
Afm Analysis

We have developed a novel instrument combining a glide tester with an Atomic Force Microscope (AFM) for hard disk drive (HDD) media defect test and analysis. The sample stays on the same test spindle during both glide test and AFM imaging without losing the relevant coordinates. This enables an in situ evaluation with the high-resolution AFM of the defects detected by the glide test. The ability for the immediate follow-on AFM analysis solves the problem of relocating the defects quickly and accurately in the current workflow. The tool is furnished with other functions such as scribing, optical imaging, and head burnishing. Typical data generated from the tool are shown at the end of the paper. It is further demonstrated that novel experiments can be carried out on the platform by taking advantage of the correlative capabilities of the tool.

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