Thermal Simulation of Silicon Ingot in Wire-saw Slicing Process

2017 ◽  
Vol 2017.30 (0) ◽  
pp. 172
Author(s):  
Takayuki Kihara ◽  
Keiichi Takanashi ◽  
Makoto Funayama ◽  
Yuki Nakashima
2013 ◽  
Vol 481 ◽  
pp. 153-157
Author(s):  
Chun Yan Yao ◽  
Zong Hua Xu ◽  
Wei Zhang ◽  
Qiao Fang Zhang ◽  
Wei Peng

Heat generated during wire saw slicing can cause silicon temperature raise and make silicon wafer warpage, especially for larger silicon wafers. In order to study the wire saw effect on silicon temperature during slicing process, three kinds of wire saw, mainly semi-fixed abrasive wire saw and traditional wire saw, are applied for slicing silicon ingot. In this paper, the thermocouple is used to measure the temperature of the silicon during wire saw slicing. The experiment results show that the temperature of the silicon increases along with the wire saw working direction and reaches maximum value near the outlet position of silicon. The temperature of the silicon sliced by semi-fixed abrasive wire saw is lower than that sliced by traditional wire saw.


1998 ◽  
Vol 120 (2) ◽  
pp. 123-128 ◽  
Author(s):  
J. Li ◽  
I. Kao ◽  
V. Prasad

Wire saw slicing is a cost effective technology with high surface quality for slicing large diameter silicon wafers. Though wire saws have been deployed to cut polycrystalline and single crystal silicon ingot since the early 1990s, very little is known about the fundamental cutting process. We investigate this manufacturing process and propose a contact stress model of wire saw slicing that illustrates the interactions among the wire, ingot, and abrasives (e.g., SiC) carried by the slurry. Stresses created by wire saw slicing silicon wafers are analyzed in this paper. During the cutting process, the wire moves at high speed (5–15 m/s) with respect to the silicon ingot. The abrasives in the slurry are lose third-body particles caught between the wire and ingot at the contact surface. The forces applied by the wire carry the abrasive particles and cause them to roll on the surface and at the same time to be constrained to indent the surface. Such rolling-indenting interactions result in the formation of isolated chips and surface cracks. The cracks and discontinuity on the surface also cause high stress concentration. As a result, the material is cut and removed. The stress fields of a single circular cone of the abrasive particle indenting on silicon crystal with normal and tangential forces can be calculated and analyzed from the modeling equations and boundary conditions. The stresses are expressed with dimensionless stress measures, as functions of normalized geometric parameters. The results show that the maximum normal stress occurs at the indentation point, while the maximum shear stress (σzx) occurs below the surface of contact, as expected. Such subsurface shear facilitates the peeling effects of the silicon cracks. Both the normal and tangential forces applied at the contacts are incorporated in the model. The model is very effective in explaining and predicting the behaviors and distributions of stresses during the cutting process, and can be used to determine the optimal geometry of the abrasive particles in the rolling-indenting process.


1994 ◽  
Vol 07 (04) ◽  
pp. 180-182
Author(s):  
N. Gofton ◽  
Joanne Cockshutt

The AO wire passer can be used as an effective guide for passage of obstetrical saw wire for osteotomy. Use of the wire saw and passer reduces soft tissue trauma by minimizing tissue dissection, and promoting positioning of the saw in close contact with the bone.


1974 ◽  
Author(s):  
Vasily D. Prian ◽  
Andy T. Calimbas ◽  
Edward A. LaBlanc

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