Contactless Measurement of Conductivity of Conducting Film by Compact Millimeter-Wave Equipment

2002 ◽  
Vol 2002 (0) ◽  
pp. 215-216
Author(s):  
Yo HIROSAWA ◽  
Yang JU ◽  
Masumi SAKA
2003 ◽  
Vol 17 (08n09) ◽  
pp. 1904-1909
Author(s):  
Yang Ju ◽  
YO Hirosawa ◽  
Masumi Saka ◽  
Hiroyuki Abé

A method for contactless measurement of the conductivity of thin conducting film was demonstrated. In order to apply the technique to on-line testing, a large standoff distance of 35 mm was obtained by using a reflector focusing sensor. The measurement was preformed by using a microwave compact equipment working at 94 GHz which was developed for decreasing the system cost. Indium Tin Oxide films having conductivity of 8.2 × 104 ~ 6.6 × 105 S/m on the glass substrates were used as the samples. Evaluation equation for determining the conductivity of Indium Tin Oxide films was generated.


2019 ◽  
Vol 13 (6) ◽  
pp. 1525-1534 ◽  
Author(s):  
Jessi E. Johnson ◽  
Oliver Shay ◽  
Chris Kim ◽  
Catherine Liao

1995 ◽  
Vol 7 (1) ◽  
pp. 89-100
Author(s):  
H. C. Han ◽  
E. S. Mansueto
Keyword(s):  

Author(s):  
Brian Drouin ◽  
Rod Kim ◽  
M.-C. Chang ◽  
Alexander Raymond ◽  
Timothy Crawford ◽  
...  

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