Two-stage spatial filtering for diffraction pattern analysis

Applied Optics ◽

10.1364/ao.20.001050 ◽

1981 ◽

Vol 20 (6) ◽

pp. 1050 ◽

Author(s):

J. A. Blodgett ◽

R. L. Easton

Keyword(s):

Diffraction Pattern ◽

Pattern Analysis ◽

Spatial Filtering ◽

Download Full-text

Two-stage spatial filtering for diffraction pattern analysis: a digital simulation of the processor using cytogenetic data

Applied Optics ◽

10.1364/ao.23.000776 ◽

1984 ◽

Vol 23 (6) ◽

pp. 776

Author(s):

Peter J. S. Hutzler ◽

Kurt Stettmaier ◽

Hans Brettel

Keyword(s):

Diffraction Pattern ◽

Pattern Analysis ◽

Digital Simulation ◽

Spatial Filtering ◽

Two Stage ◽

Cytogenetic Data

Download Full-text

Shape distinction of particulate materials by laser diffraction pattern analysis

Metal Powder Report ◽

10.1016/s0026-0657(03)80801-9 ◽

2003 ◽

Vol 58 (6) ◽

pp. 49

Keyword(s):

Diffraction Pattern ◽

Pattern Analysis ◽

Laser Diffraction ◽

Particulate Materials ◽

Laser Diffraction Pattern

Download Full-text

Diffraction Pattern Analysis

Handbook of Crystallography ◽

10.1007/978-1-4612-3052-6_3 ◽

1991 ◽

pp. 17-27

Author(s):

A. G. Jackson

Keyword(s):

Diffraction Pattern ◽

Pattern Analysis

Download Full-text

On the Possibility of Imaging Microstructures by Soft X-Ray Diffraction Pattern Analysis

X-Ray Microscopy - Springer Series in Optical Sciences ◽

10.1007/978-3-540-38833-3_36 ◽

1984 ◽

pp. 314-316 ◽

Author(s):

D. Sayre ◽

R. P. Haelbich ◽

J. Kirz ◽

W. B. Yun

Keyword(s):

Diffraction Pattern ◽

Pattern Analysis ◽

X Ray Diffraction ◽

Download Full-text

Two-stage online inference model for traffic pattern analysis and anomaly detection

Machine Vision and Applications ◽

10.1007/s00138-014-0629-y ◽

2014 ◽

Vol 25 (6) ◽

pp. 1501-1517 ◽

Author(s):

Hawook Jeong ◽

Youngjoon Yoo ◽

Kwang Moo Yi ◽

Jin Young Choi

Keyword(s):

Anomaly Detection ◽

Pattern Analysis ◽

Inference Model ◽

Two Stage ◽

Traffic Pattern ◽

Online Inference

Download Full-text

Identification of intermetallic phases in a eutectic Al?Si casting alloy using electron backscatter diffraction pattern analysis

Scripta Materialia ◽

10.1016/j.scriptamat.2004.04.015 ◽

2004 ◽

Vol 51 (3) ◽

pp. 215-219 ◽

Author(s):

M KRAL

Keyword(s):

Diffraction Pattern ◽

Pattern Analysis ◽

Electron Backscatter Diffraction ◽

Intermetallic Phases ◽

Casting Alloy ◽

Electron Backscatter ◽

Backscatter Diffraction

Download Full-text

In-Line Far-Field Holography And Diffraction Pattern Analysis : New Developments

10.1117/12.952439 ◽

1986 ◽

Author(s):

C. Ozkul ◽

D. Allano ◽

M. Trinite ◽

N. Anthore

Keyword(s):

Diffraction Pattern ◽

Pattern Analysis ◽

Far Field ◽

New Developments

Download Full-text

System Design for Metaphase Finding by Diffraction Pattern Analysis

Optoelectronics in Medicine ◽

10.1007/978-3-642-68202-5_25 ◽

1982 ◽

pp. 216-221

Author(s):

P. J. S. Hutzler ◽

K. Stettmaier

Keyword(s):

System Design ◽

Diffraction Pattern ◽

Pattern Analysis

Download Full-text

Shadow: A System for X-ray Powder Diffraction Pattern Analysis

Advances in X-ray Analysis ◽

10.1154/s0376030800020851 ◽

1988 ◽

Vol 32 ◽

pp. 523-530

Author(s):

Scott A. Howard

Keyword(s):

Diffraction Pattern ◽

Powder Diffraction ◽

Pattern Analysis ◽

Shadow System ◽

X Ray ◽

The Shadow system consists of a set of programs and files, the relation of which is illustrated in Figures 1 and 2. Of the three programs in the system, Shadow and XRDPLT are used routinely. The third, INSCAL, is used in the determination of various parameters characterizing the instrument. Two files, Shadow.DFT and XRDPLT.DFT, contain default values for parameters controlling the reduction and display of data. A third file, WSGDAT, contains the instrument parameters.

Download Full-text

Shadow: A System for X-Ray Powder Diffraction Pattern Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4757-9110-5_63 ◽

1989 ◽

pp. 523-530 ◽

Author(s):

Scott A. Howard

Keyword(s):

Diffraction Pattern ◽

Powder Diffraction ◽

Pattern Analysis ◽

Download Full-text