Optical properties of silicon-nitride atomic-force microscopy tips in scanning tunneling optical microscopy: experimental study

1995 ◽  
Vol 34 (4) ◽  
pp. 703 ◽  
Author(s):  
M. Castagne ◽  
C. Prioleau ◽  
J. P. Fillard
Keyword(s):  
Experimental Study ◽  
Atomic Force Microscopy ◽  
Optical Properties ◽  
Silicon Nitride ◽  
Optical Microscopy ◽  
Scanning Tunneling ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Exploring Intramolecular Methyl–Methyl Coupling on a Metal Surface for Edge-Extended Graphene Nanoribbons

2021 ◽  
Vol 03 (02) ◽  
pp. 128-133
Author(s):  
Zijie Qiu ◽  
Qiang Sun ◽  
Shiyong Wang ◽  
Gabriela Borin Barin ◽  
Bastian Dumslaff ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Atomic Force Microscopy ◽  
High Resolution ◽  
Graphene Nanoribbons ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Methyl Methyl ◽  
Atomic Force ◽  
Edge Extension

Intramolecular methyl–methyl coupling on Au (111) is explored as a new on-surface protocol for edge extension in graphene nanoribbons (GNRs). Characterized by high-resolution scanning tunneling microscopy, noncontact atomic force microscopy, and Raman spectroscopy, the methyl–methyl coupling is proven to indeed proceed at the armchair edges of the GNRs, forming six-membered rings with sp3- or sp2-hybridized carbons.

scholarly journals Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy

2015 ◽  
Vol 1 (1) ◽  
pp. 15-23 ◽  
Author(s):  
Natalia A. Lashkova ◽  
Nikita V. Permiakov ◽  
Alexander I. Maximov ◽  
Yulia M. Spivak ◽  
Vyacheslav A. Moshnikov
Keyword(s):  
Atomic Force Microscopy ◽  
Local Analysis ◽  
Scanning Tunneling ◽  
Force Microscopy ◽  
Atomic Force

Adsorption and Desorption of AlCl3on Si(111)7×7 Observed by Scanning Tunneling Microscopy and Atomic Force Microscopy

1993 ◽  
Vol 32 (Part 1, No. 12B) ◽  
pp. 6200-9202 ◽  
Author(s):  
Katsuhiro Uesugi ◽  
Takaharu Takiguchi ◽  
Michiyoshi Izawa ◽  
Masamichi Yoshimura ◽  
Takafumi Yao
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Adsorption And Desorption ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy of Annealed Plain Carbon Steels

2015 ◽  
Author(s):  
Surendra Kumar Gupta ◽  
Patricia Iglesias Victoria
Keyword(s):  
Atomic Force Microscopy ◽  
Optical Microscopy ◽  
Interlamellar Spacing ◽  
Lamellar Spacing ◽  
Optical Microscope ◽  
Carbon Steels ◽  
Force Microscopy ◽  
Atomic Force

Microstructure of annealed plain carbon steels is examined using optical microscopy. When the inter-lamellar spacing in pearlite is small, optical microscope at 1000X is unable to resolve the ferrite and cementite lamellae. In hyper-eutectoid steels, cementite in pearlite appears as darker phase whereas the pro-eutectoid cementite appears as a lighter phase. Atomic force microscopy (AFM) of etched steels is able to resolve ferrite and cementite lamellae in pearlite at similar magnifications. Both cementite in pearlite as well as pro-eutectoid cementite appear as raised areas (hills) in AFM images. Interlamellar spacing in pearlite increases with increasing hardenability of steel.

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