Determination of the complex index of refraction and size distribution of aerosols from polar nephelometer measurements

1999 ◽  
Vol 38 (12) ◽  
pp. 2331 ◽  
Author(s):  
Fengsheng Zhao
Materials ◽  
2020 ◽  
Vol 13 (24) ◽  
pp. 5736
Author(s):  
Aaron M. Ross ◽  
Giuseppe M. Paternò ◽  
Stefano Dal Conte ◽  
Francesco Scotognella ◽  
Eugenio Cinquanta

In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers–Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1–3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction.


2019 ◽  
pp. 366-397
Author(s):  
Richard Freeman ◽  
James King ◽  
Gregory Lafyatis

Physical models that relate the generalized complex permittivity and complex conductivity to the electronic structure of matter are introduced. The classical models of Drude and Lorentz give expressions for the complex index of refraction in a dielectric, while Drude models a metal as a plasma. Reflection and transmission properties of interfaces are expressed in terms of the complex index of refraction. Special consideration is given to the behavior of light propagation in the frequency vicinity of an atomic resonance of the material. Finally, measurement techniques are presented that are applicable to the determination of the parameters of a Lorentz/Drude representation of electromagnetic transmission in matter.


2012 ◽  
Vol 51 (12) ◽  
pp. 2152-2171 ◽  
Author(s):  
Benjamin T. Johnson ◽  
Grant W. Petty ◽  
Gail Skofronick-Jackson

AbstractA simplified framework is presented for assessing the qualitative sensitivities of computed microwave properties, satellite brightness temperatures, and radar reflectivities to assumptions concerning the physical properties of ice-phase hydrometeors. Properties considered included the shape parameter μ of a gamma size distribution and the melted-equivalent mass median diameter D0, the particle density, the dielectric mixing formula, and the choice of complex index of refraction for ice. These properties are examined for selected radiometer frequencies of 18.7, 36.5, 89.0, and 150.0 GHz and radar frequencies at 2.8, 13.4, 35.6, and 94.0 GHz—consistent with existing and planned remote sensing instruments. Passive and active microwave observables of ice particles are found to be extremely sensitive to the D0 of the size distribution. Similar large sensitivities are found for variations in the ice volume fraction whenever the geometric mass median diameter exceeds approximately ⅛th of the wavelength. At 94 GHz the two-way path-integrated attenuation is potentially large for dense/compact particles. The distribution parameter μ has a comparatively weak effect on any observable: less than 1–2 K in brightness temperature and a maximum of 2.7 dB (S band only) in the effective radar reflectivity. Reversal of the roles of ice and air in the Maxwell Garnett dielectric mixing formula leads to a substantial change in both microwave brightness temperature (~10 K) and radar reflectivity (approximately 2 dB across all frequencies). The choice of the complex index of refraction of ice can produce a 3%–4% change in the brightness temperature depression.


1987 ◽  
Vol 2 (5) ◽  
pp. 645-647 ◽  
Author(s):  
Shuhan Lin ◽  
Shuguang Chen

Optical properties of plasma-deposited amorphous hydrogenated carbon films were studied by spectroscopic ellipsometry. From the ellipsometry data, the real and imaginary parts, n and k, of the complex index of refraction of the film have been deduced for photon energies between 2.0 and 4.0 eV for as-grown as well as for thermally annealed films. Here n and k showed considerable variation with subsequent annealing, even under 400°C. A tentative explanation of the results is proposed.


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