scholarly journals Determination of Size and Complex Index of Refraction of Single Particles with ElasticLight Scattering

2020 ◽  
Author(s):  
Mir Waez ◽  
Steven Eckels ◽  
Christopher Sorensen
Keyword(s):  
Index Of Refraction ◽  
Single Particles ◽  
Complex Index ◽  
Complex Index Of Refraction

scholarly journals Anisotropic Complex Refractive Indices of Atomically Thin Materials: Determination of the Optical Constants of Few-Layer Black Phosphorus

Materials ◽  
2020 ◽  
Vol 13 (24) ◽  
pp. 5736
Author(s):  
Aaron M. Ross ◽  
Giuseppe M. Paternò ◽  
Stefano Dal Conte ◽  
Francesco Scotognella ◽  
Eugenio Cinquanta
Keyword(s):  
Optical Constants ◽  
Transition Metal Dichalcogenides ◽  
Black Phosphorus ◽  
Index Of Refraction ◽  
Refractive Indices ◽  
Complex Index ◽  
Metal Dichalcogenides ◽  
Reflectance Data ◽  
Complex Index Of Refraction

In this work, studies of the optical constants of monolayer transition metal dichalcogenides and few-layer black phosphorus are briefly reviewed, with particular emphasis on the complex dielectric function and refractive index. Specifically, an estimate of the complex index of refraction of phosphorene and few-layer black phosphorus is given. The complex index of refraction of this material was extracted from differential reflectance data reported in the literature by employing a constrained Kramers–Kronig analysis combined with the transfer matrix method. The reflectance contrast of 1–3 layers of black phosphorus on a silicon dioxide/silicon substrate was then calculated using the extracted complex indices of refraction.

Models of Electromagnetic Response of Materials

2019 ◽  
pp. 366-397
Author(s):  
Richard Freeman ◽  
James King ◽  
Gregory Lafyatis
Keyword(s):  
Light Propagation ◽  
Measurement Techniques ◽  
Index Of Refraction ◽  
Physical Models ◽  
Electromagnetic Response ◽  
Complex Index ◽  
Classical Models ◽  
Plasma Reflection ◽  
Complex Index Of Refraction

Physical models that relate the generalized complex permittivity and complex conductivity to the electronic structure of matter are introduced. The classical models of Drude and Lorentz give expressions for the complex index of refraction in a dielectric, while Drude models a metal as a plasma. Reflection and transmission properties of interfaces are expressed in terms of the complex index of refraction. Special consideration is given to the behavior of light propagation in the frequency vicinity of an atomic resonance of the material. Finally, measurement techniques are presented that are applicable to the determination of the parameters of a Lorentz/Drude representation of electromagnetic transmission in matter.

Optical properties of amorphous hydrogenated carbon films: A spectroscopic ellipsometry study

1987 ◽  
Vol 2 (5) ◽  
pp. 645-647 ◽  
Author(s):  
Shuhan Lin ◽  
Shuguang Chen
Keyword(s):  
Optical Properties ◽  
Spectroscopic Ellipsometry ◽  
Carbon Films ◽  
Index Of Refraction ◽  
The Real ◽  
Complex Index ◽  
Tentative Explanation ◽  
Amorphous Hydrogenated Carbon ◽  
Ellipsometry Data ◽  
Complex Index Of Refraction

Optical properties of plasma-deposited amorphous hydrogenated carbon films were studied by spectroscopic ellipsometry. From the ellipsometry data, the real and imaginary parts, n and k, of the complex index of refraction of the film have been deduced for photon energies between 2.0 and 4.0 eV for as-grown as well as for thermally annealed films. Here n and k showed considerable variation with subsequent annealing, even under 400°C. A tentative explanation of the results is proposed.

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