Study on the interphase interface structure andevolution of single crystal Ni-based superalloy basedon HRTEM image analysis

2021 ◽  
Author(s):  
Ruijun He ◽  
Hongye Zhang ◽  
Huihui Wen ◽  
Huimin Xie ◽  
Zhanwei Liu
2020 ◽  
Vol 5 (1) ◽  
pp. 13-17
Author(s):  
György Zoltán Radnóczi ◽  
Zoltán Herceg ◽  
Tamás Rafael Kiss

AbstractVery accurate measurement of distances in the order of several µm is demonstrated on a single crystal Si sample by counting the lattice fringes on stitched high resolution TEM/STEM images. Stitching of TEM images commonly relies on correspondence points found in the image, however, the nearly perfect periodic nature of a lattice image renders such a procedure very unreliable. To overcome this difficulty artificial correspondence points are created on the sample using the electron beam. An accuracy better than 1% can be reached while measuring distances in the order of 1 µm. A detailed description of the process is provided, and its usability for accurately measuring large distances is discussed in detail.


2002 ◽  
Vol 738 ◽  
Author(s):  
C. M. Wang ◽  
S. Thevuthasan ◽  
V. Shutthanandan ◽  
A. Cavanagh ◽  
J. Walton ◽  
...  

ABSTRACTGold nanoclusters dispersed in single crystal MgO were prepared by ion implantation and subsequent annealing at 1000 °C. The morphological feature, size, crystallographic orientation of the Au nanoclusters with respect to the MgO matrix, and the interface structure between the Au nanoclusters and MgO were investigated using transmission electron microscopy. During annealing, the Au clusters nucleate coherently in the MgO lattice, leading to an epitaxial orientation relationship of [010] MgO// [010]Au and (200)MgO//(200)Au that is maintained for all the Au clusters. A critical size for the coherent-semicoherent interface transition is observed to be in the range from ∼5 to 8 nm for Au clusters in MgO. Au clusters larger than this critical size exhibit faceting on the {001} planes. The precipitated Au also exhibits internal dislocations.


2014 ◽  
Vol 64 ◽  
pp. 100-112 ◽  
Author(s):  
E.G. Fu ◽  
Y. Fang ◽  
M.J. Zhuo ◽  
S.J. Zheng ◽  
Z.X. Bi ◽  
...  

2002 ◽  
Vol 92 (3-4) ◽  
pp. 209-213 ◽  
Author(s):  
M Romeo ◽  
J.C Arnault ◽  
G Ehret ◽  
F Banhart ◽  
F.Le Normand

Crystals ◽  
2019 ◽  
Vol 9 (3) ◽  
pp. 149 ◽  
Author(s):  
Philipp Hallensleben ◽  
Felicitas Scholz ◽  
Pascal Thome ◽  
Helge Schaar ◽  
Ingo Steinbach ◽  
...  

In the present work, we investigate the evolution of mosaicity during seeded Bridgman processing of technical Ni-based single crystal superalloys (SXs). For this purpose, we combine solidification experiments performed at different withdrawal rates between 45 and 720 mm/h with advanced optical microscopy and quantitative image analysis. The results obtained in the present work suggest that crystal mosaicity represents an inherent feature of SXs, which is related to elementary stochastic processes which govern dendritic solidification. In SXs, mosaicity is related to two factors: inherited mosaicity of the seed crystal and dendrite deformation. Individual SXs have unique mosaicity fingerprints. Most crystals differ in this respect, even when they were produced using identical processing conditions. Small differences in the orientation spread of the seed crystals and small stochastic orientation deviations continuously accumulate during dendritic solidification. Direct evidence for dendrite bending in a seeded Bridgman growth process is provided. It was observed that continuous or sudden bending affects the growth directions of dendrites. We provide evidence which shows that some dendrites continuously bend by 1.7° over a solidification distance of 25 mm.


1994 ◽  
Vol 22 (4) ◽  
pp. 199-218 ◽  
Author(s):  
Y. Yoshitomi ◽  
K. Ohta ◽  
J. Harase ◽  
Y. Suga

A method for measuring strain by analyzing sharpness of Electron Channeling Pattern (ECP) with Image analysis has been newly developed. The relative value of sharpness of first-order pseudo-Kikuchi line in ECP is used as a parameter of strain. Strain change of Fe-3.25%Si alloy single crystal and polycrystal during deformation and recrystallization was analyzed by this method. This method was compared with the conventional methods; hardness and line broadening of X-ray. This method can be used for measuring strain in material with any crystal orientation.


2000 ◽  
Vol 652 ◽  
Author(s):  
Aude Taisne ◽  
Brigitte Décamps ◽  
Louisette Priester

ABSTRACTElementary mechanisms of deformation by fatigue in duplex stainless steels bicrystals are studied by transmission electron microscopy (TEM). An attempt is made to correlate the bicrystal macroscopic behaviour with the interphase interface crystallography.


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