Adjustment of optical path-length difference of nested Mach-Zehnder structure utilizing optical phase shift in waveguide junction

CLEO: 2014 ◽  
2014 ◽  
Author(s):  
Akito Chiba ◽  
Tetsuya Kawanishi ◽  
Takahide Sakamoto ◽  
Kaoru Higuma ◽  
Kazumasa Takada ◽  
...  
2016 ◽  
Vol 55 (11) ◽  
pp. 2904 ◽  
Author(s):  
Shumpei Shimada ◽  
Makoto Shizuka ◽  
Neisei Hayashi ◽  
Yosuke Mizuno ◽  
Kentaro Nakamura

1999 ◽  
Vol 605 ◽  
Author(s):  
Joseph Miragliotta ◽  
R. Osiander ◽  
J. L. Champion ◽  
D. A. Oursler ◽  
T.J. Kistenmacher

AbstractWe report the results of an optical interferometric study, which was designed to measure the magnetic-field induced displacement of a resonating xylophone bar MEMS magnetometer. The MEMS magnetometer is a Lorentz-force sensor, which transduces an alternating current and an orthogonal directed magnetic field into an alternating displacement of the xylophone bar. The Michelson interferometer system includes optics and electronics for active stabilization of the optical path length difference between the reference and sample beams. The active stabilization results in the ability to control or detect pathlength differences as small as ∼ 0.6 ×10−3 Å. With this level of operational sensitivity, the presence of a one nano Tesla magnetic field was found to produce a detectable bar displacement on the order of ∼10−3 Å. In addition to the high sensitivity, the interferometer photodetector displayed linear behavior over six decades of optical path length differences, which corresponded to a magnetic field dynamic range that spanned nano- to milli-Tesla amplitudes.


1995 ◽  
Vol 11 (2) ◽  
pp. 109-117 ◽  
Author(s):  
David A. Benaron ◽  
C. Dean Kurth ◽  
James M. Steven ◽  
Maria Delivoria-Papadopoulos ◽  
Britton Chance

2000 ◽  
Vol 627 ◽  
Author(s):  
Gabriel Popescu ◽  
Aristide Dogariu

ABSTRACTIn many industrial applications involving granular media, knowledge about the structural transformations suffered during the industrial process is desirable. Optical techniques are noninvasive, fast, and versatile tools for monitoring such transformations. We have recently introduced optical path-length spectroscopy as a new technique for random media investigation. The principle of the method is to use a partially coherent source in a Michelson interferometer, where the fields from a reference mirror and the sample are combined to obtain an interference signal. When the system under investigation is a multiple-scattering medium, by tuning the optical length of the reference arm, the optical path-length probability density of light backscattered from the sample is obtained. This distribution carries information about the structural details of the medium. In the present paper, we apply the technique of optical path-length spectroscopy to investigate inhomogeneous distributions of particulate dielectrics such as ceramics and powders. The experiments are performed on suspensions of systems with different solid loads, as well as on powders and suspensions of particles with different sizes. We show that the methodology is highly sensitive to changes in volume concentration and particle size and, therefore, it can be successfully used for real-time monitoring. In addition, the technique is fiber optic-based and has all the advantages associated with the inherent versatility.


2021 ◽  
Vol 11 (1) ◽  
Author(s):  
L. Clermont ◽  
W. Uhring ◽  
M. Georges

AbstractUnderstanding stray light (SL) is a crucial aspect in the development of high-end optical instruments, for instance space telescopes. As it drives image quality, SL must be controlled by design and characterized experimentally. However, conventional SL characterization methods are limited as they do not provide information on its origins. The problem is complex due to the diversity of light interaction processes with surfaces, creating various SL contributors. Therefore, when SL level is higher than expected, it can be difficult to determine how to improve the system. We demonstrate a new approach, ultrafast time-of-flight SL characterization, where a pulsed laser source and a streak camera are used to record individually SL contributors which travel with a specific optical path length. Furthermore, the optical path length offers a means of identification to determine its origin. We demonstrate this method in an imaging system, measuring and identifying individual ghosts and scattering components. We then show how it can be used to reverse-engineer the instrument SL origins.


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