Thin-film thickness profile and its refractive index measurements by dispersive white-light interferometry
2006 ◽
Vol 14
(24)
◽
pp. 11885
◽
Young-Sik Ghim
◽
Seung-Woo Kim
Young-Sik Ghim
◽
Seung-Woo Kim
2018 ◽
Vol 19
(2)
◽
pp. 213-219
◽
Min-Gab Kim
◽
Heui-Jae Pahk
Young-Sik Ghim
◽
Joonho You
◽
Seung-Woo Kim
Yu-Xen Lin
◽
Meng-Chi Li
◽
Cheng-Chung Lee
Xu Lu
◽
Zhangjun Yu
◽
Jun Yang
◽
Yonggui Yuan
◽
Hanyang Li
◽
...
2014 ◽
Vol 550
◽
pp. 10-16
◽
B. Maniscalco
◽
P.M. Kaminski
◽
J.M. Walls
2012 ◽
Vol 51
(23)
◽
pp. 5668
◽
Jing-tao Dong
◽
Rong-sheng Lu
T. Y. Chen
◽
Y. J. Lin
◽
S. G. Hu
◽
S. L. Yang
◽
J. C. Chung
2008 ◽
Vol 46
(2)
◽
pp. 179-184
◽
Young-Min Hwang
◽
Sung-Won Yoon
◽
Jung-Hwan Kim
◽
Souk Kim
◽
Heui-Jae Pahk
Yuanbo Zheng
◽
Chunxiao Chu
◽
Xia Wang