Organic Thin Film Thickness Profile and Refractive Index Measurements by White-Light Scanning Interferometer

2016 ◽  
Author(s):  
Yu-Xen Lin ◽  
Meng-Chi Li ◽  
Cheng-Chung Lee
Keyword(s):  
Thin Film ◽  
Refractive Index ◽  
Film Thickness ◽  
White Light ◽  
Organic Thin Film ◽  
Thin Film Thickness ◽  
Thickness Profile ◽  
Scanning Interferometer

Organic thin film thickness-dependent photocurrents polarity in graphene heterojunction phototransistor

Carbon ◽  
2021 ◽  
Vol 178 ◽  
pp. 506-514
Author(s):  
Meiyu He ◽  
Jiayue Han ◽  
Xingwei Han ◽  
Jun Gou ◽  
Ming Yang ◽  
...  
Keyword(s):  
Thin Film ◽  
Film Thickness ◽  
Organic Thin Film ◽  
Thin Film Thickness

Thin-film thickness profile measurement using wavelet transform in wavelength-scanning interferometry

2008 ◽  
Vol 46 (2) ◽  
pp. 179-184 ◽  
Author(s):  
Young-Min Hwang ◽  
Sung-Won Yoon ◽  
Jung-Hwan Kim ◽  
Souk Kim ◽  
Heui-Jae Pahk
Keyword(s):  
Thin Film ◽  
Wavelet Transform ◽  
Film Thickness ◽  
Profile Measurement ◽  
Thin Film Thickness ◽  
Thickness Profile ◽  
Wavelength Scanning

Simulation of the organic thin film thickness distribution for multi-source thermal evaporation process

Vacuum ◽  
2010 ◽  
Vol 85 (3) ◽  
pp. 448-451 ◽  
Author(s):  
Hu Chen ◽  
Yang Gang ◽  
Chen Wenbin ◽  
Luo Kaijun ◽  
Liu Feng
Keyword(s):  
Thin Film ◽  
Film Thickness ◽  
Thermal Evaporation ◽  
Thickness Distribution ◽  
Evaporation Process ◽  
Organic Thin Film ◽  
Thin Film Thickness
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