Near-field optical microscope image formation: a theoretical and experimental study

1997 ◽  
Vol 22 (13) ◽  
pp. 955 ◽  
Author(s):  
A. V. Zvyagin ◽  
J. D. White ◽  
M. Ohtsu
Keyword(s):  
Experimental Study ◽  
Near Field ◽  
Image Formation ◽  
Optical Microscope ◽  
Microscope Image ◽  
Optical Microscope Image

Characterization of Interconnect Defects Due to Electromigration Using Scanning Thermal Microscopy

2003 ◽  
Author(s):  
E.X.W. Wu ◽  
X.H. Zheng ◽  
J.C.H. Phang ◽  
L.J. Balk ◽  
J.R. Lloyd
Keyword(s):  
Temperature Distribution ◽  
Optical Microscope ◽  
Physical Structure ◽  
Scanning Thermal Microscopy ◽  
Thermal Microscopy ◽  
Microscope Image ◽  
Optical Microscope Image ◽  
Temperature Distributions

Abstract In this paper, the temperature distributions around interconnect defects due to electromigration are presented. A method to overlay the temperature distribution over the optical microscope image of the physical defect has also been developed. This allows a direct correlation of the temperature distribution and the physical structure of the defect.

Influence of the probe-sample interaction angle on image formation in apertureless scanning near field optical microscope

2014 ◽  
Vol 28 (26) ◽  
pp. 1450205
Author(s):  
J. M. Merlo ◽  
V. Coello ◽  
R. Cortés ◽  
J. F. Aguilar ◽  
A. Flores-Rosas
Keyword(s):  
Total Internal Reflection ◽  
Near Field ◽  
Image Formation ◽  
Optical Microscope ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Similar Shape ◽  
Atomic Force ◽  
Dielectric Sample ◽  
Difference Time

Using the two-dimensional finite difference time domain method, we report on the image formation of an apertureless scanning near field optical microscope. It is found that the obtained images are influenced by the angle at which the probe interacts with a dielectric sample under total internal reflection illumination. The scanning probe is assumed to be a sharp silver tip with similar shape to those used in atomic force microscopy. We show that the near-field optical response produced by semi-circular and square imperfections are significantly affected with small (0°–10°) variations of the probe-sample interaction angle.

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