scholarly journals Ellipsometric study of the optical properties of n-type superconductor La_19Ce_01CuO_4

2015 ◽  
Vol 5 (9) ◽  
pp. 2047 ◽  
Author(s):  
Minglin Zhao ◽  
Jie Lian ◽  
Zhaozong Sun ◽  
Wenfu Zhang ◽  
Mengmeng Li ◽  
...  
Keyword(s):  
Optical Properties ◽  
Ellipsometric Study

scholarly journals Optical properties of Au-Ag alloys: An ellipsometric study

2014 ◽  
Vol 4 (2) ◽  
pp. 403 ◽  
Author(s):  
Ovidio Peña-Rodríguez ◽  
Magdalena Caro ◽  
Antonio Rivera ◽  
José Olivares ◽  
José Manuel Perlado ◽  
...  
Keyword(s):  
Optical Properties ◽  
Ellipsometric Study

Spectroscopic ellipsometric study of tetrahedral amorphous carbon films: optical properties and modelling

2001 ◽  
Vol 10 (3-7) ◽  
pp. 1132-1136 ◽  
Author(s):  
A. Canillas ◽  
M.C. Polo ◽  
J.L. Andújar ◽  
J. Sancho ◽  
S. Bosch ◽  
...  
Keyword(s):  
Optical Properties ◽  
Amorphous Carbon ◽  
Carbon Films ◽  
Amorphous Carbon Films ◽  
Tetrahedral Amorphous Carbon ◽  
Ellipsometric Study

Ellipsometric study of optical properties of oriented SBT thin films

2001 ◽  
Vol 264 (1) ◽  
pp. 243-248 ◽  
Author(s):  
D. Mo ◽  
J. B. Xu ◽  
Y. Liu ◽  
G. D. Hu
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Ellipsometric Study

Ellipsometric study on temperature dependent optical properties of topological bismuth film

2017 ◽  
Vol 421 ◽  
pp. 899-904 ◽  
Author(s):  
Liao Yang ◽  
Yu-Xiang Zheng ◽  
Shang-Dong Yang ◽  
Zhun-Hua Liu ◽  
Jin-Bo Zhang ◽  
...  
Keyword(s):  
Optical Properties ◽  
Bismuth Film ◽  
Temperature Dependent ◽  
Ellipsometric Study

Spectroscopic ellipsometric study of CVD diamond films: modelling and optical properties in the energy range of 0.1–0.4 eV

2004 ◽  
Vol 37 (14) ◽  
pp. 1976-1979 ◽  
Author(s):  
Linjun Wang ◽  
Yiben Xia ◽  
Minglong Zhang ◽  
Hujiang Shen ◽  
Qingfeng Su ◽  
...  
Keyword(s):  
Optical Properties ◽  
Energy Range ◽  
Diamond Films ◽  
Cvd Diamond ◽  
Ellipsometric Study

Ellipsometric Study of the Optical Properties of InGaAsN Layers

2000 ◽  
Vol 39 (Part 2, No. 9A/B) ◽  
pp. L898-L900 ◽  
Author(s):  
Pei-Wen Li ◽  
Huei-Chen Guang ◽  
Nein-Yi Li
Keyword(s):  
Optical Properties ◽  
Ellipsometric Study

Optical properties of "diamondlike" carbon films: An ellipsometric study

1983 ◽  
Vol 28 (12) ◽  
pp. 7229-7235 ◽  
Author(s):  
A. Azim Khan ◽  
David Mathine ◽  
John A. Woollam ◽  
Y. Chung
Keyword(s):  
Optical Properties ◽  
Carbon Films ◽  
Diamondlike Carbon ◽  
Ellipsometric Study

Structural and ellipsometric study on tailored optical properties of tantalum oxynitride films deposited by reactive sputtering

2014 ◽  
Vol 47 (47) ◽  
pp. 475201 ◽  
Author(s):  
Angélique Bousquet ◽  
Fadi Zoubian ◽  
Joël Cellier ◽  
Christine Taviot-Gueho ◽  
T Sauvage ◽  
...  
Keyword(s):  
Optical Properties ◽  
Reactive Sputtering ◽  
Ellipsometric Study

Ellipsometric study of optical properties of Sm-doped ZnO thin films Co-deposited by RF-Magnetron sputtering

Optik ◽  
2017 ◽  
Vol 148 ◽  
pp. 172-180 ◽  
Author(s):  
D.M. Alsebaie ◽  
W. Shirbeeny ◽  
A. Alshahrie ◽  
M. Sh. Abdel-Wahab
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Magnetron Sputtering ◽  
Rf Magnetron Sputtering ◽  
Zno Thin Films ◽  
Ellipsometric Study ◽  
Doped Zno

Ellipsometric Study of the Interface Between Silicon and Silica

1993 ◽  
Vol 318 ◽  
Author(s):  
R. H. Doremus ◽  
S. C. Kao
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Transition Layer ◽  
Interfacial Layer ◽  
Vitreous Silica ◽  
Refractive Indices ◽  
Bulk Silicon ◽  
Ellipsometric Study

ABSTRACTEllipsometric measurements of surfaces of oxidized silicon give information on the optical properties, structure and composition of the interface between the silicon and oxide. From such measurements in ambient liquids with different refractive indices, some close to that of the oxide, we conclude that there is an interfacial layer about one nm thick at all oxide thicknesses. This layer is either a transition layer of partially oxidized silicon or a layer of silicon of higher absorption than bulk silicon. The oxide has the refractive index of vitreous silica at all thicknesses.

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