Some Practical Aspects of FT-IR/PBDS. Part II: Sample Handling Procedures

FT-IR photothermal beam deflection spectroscopy (PBDS) is truly nondestructive in that none of the sample preparation methods needed for the IR examination of solids are mandated. Such nondestructive examination is, however, inefficient—in that long scanning times are frequently needed—and is not really required with many samples. If it is permissible to subject the sample to a simple hand grinding, efficiency can be greatly improved. Sample preparation and handling are discussed, and the peculiarities of certain samples are described. Particular emphasis is placed on the necessity of proper sample handling for surface studies, data of the vacuum pyrolysis of polyvinyledene being used as example.

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Different solid sample preparation methods affecting the spectral similarity of salmon calcitonin

Spectroscopy An International Journal ◽

10.1155/2010/721325 ◽

2010 ◽

Vol 24 (5) ◽

pp. 511-516 ◽

Cited By ~ 2

Author(s):

Shan-Yang Lin ◽

Chih-Cheng Lin ◽

Ting-Huei Lee

Keyword(s):

Solid State ◽

Sample Preparation ◽

Conformational Changes ◽

Salmon Calcitonin ◽

Structural Similarity ◽

Preparation Methods ◽

Model Protein ◽

Ft Ir ◽

Ir Microspectroscopy ◽

Sample Preparation Methods

Salmon calcitonin (sCT) was selected as a model protein drug for investigating its structural similarity in the solid state by four sample preparation methods, such as tape, smeared, CaF2and film methods. The conformational changes of sCT in the solid state were estimated by using a second-derivative Fourier transform infrared (FT-IR) microspectroscopy. The tape method was acted as a standard reference.The value of correlation coefficient (r) for smeared method was higher than that of other method, indicating that a novel technique by smearing sCT powder on the surface of KBr pellet was the best optimal sample preparation method.

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Improving Sample Preparation Methods For Cannabis-Infused Edible And Topical Products

Planta Medica ◽

10.1055/s-0036-1578645 ◽

2016 ◽

Vol 82 (05) ◽

Author(s):

M Wilcox ◽

M Jacyno ◽

J Marcu ◽

J Neal-Kababick

Keyword(s):

Sample Preparation ◽

Preparation Methods ◽

Sample Preparation Methods

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150. Comparison of Direct and Indirect Sample Preparation Methods for Asbestos Analysis

10.3320/1.2765665 ◽

2001 ◽

Author(s):

L. Burrelli ◽

J. Spencer

Keyword(s):

Sample Preparation ◽

Preparation Methods ◽

Sample Preparation Methods

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Thin-Die Flip Chip Physical-FA Process Flow

ISTFA 2002: Conference Proceedings from the 28th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2002p0189 ◽

2002 ◽

Author(s):

Andrew J. Komrowski ◽

N. S. Somcio ◽

Daniel J. D. Sullivan ◽

Charles R. Silvis ◽

Luis Curiel ◽

...

Keyword(s):

Sample Preparation ◽

Failure Analysis ◽

Flip Chip ◽

Semiconductor Industry ◽

Organic Substrate ◽

Fault Isolation ◽

Preparation Methods ◽

Chip Technology ◽

Isolation Test ◽

Sample Preparation Methods

Abstract The use of flip chip technology inside component packaging, so called flip chip in package (FCIP), is an increasingly common package type in the semiconductor industry because of high pin-counts, performance and reliability. Sample preparation methods and flows which enable physical failure analysis (PFA) of FCIP are thus in demand to characterize defects in die with these package types. As interconnect metallization schemes become more dense and complex, access to the backside silicon of a functional device also becomes important for fault isolation test purposes. To address these requirements, a detailed PFA flow is described which chronicles the sample preparation methods necessary to isolate a physical defect in the die of an organic-substrate FCIP.

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