Electrospray Mass Spectrometry as a Technique for Elemental Analysis: Preliminary Results

1992 ◽  
Vol 46 (3) ◽  
pp. 401-406 ◽  
Author(s):  
George R. Agnes ◽  
Gary Horlick
Keyword(s):  
Mass Spectrometry ◽  
Elemental Analysis ◽  
Alkali Metals ◽  
Electrospray Mass Spectrometry ◽  
Low Cost ◽  
Ion Source ◽  
Preliminary Results ◽  
Background Ions ◽  
Elemental Mass ◽  
Elemental Mass Spectrometry

Preliminary results for the analytical use of electrospray mass spectrometry (ES-MS) for elemental analysis are presented. Spectra with the declustered plus-one ion (M+) as the dominant species have been measured for the alkali metals (Li, Na, K, Rb, and Cs) and for several transition metals (Cr, Mn, Fe, Co, Ni, Cu, Zn, Ag, and Cd) in both aqueous and methanol solvents. A number of background ions are also observed including MH+, MO+, MOH+, and MOH(H2O)+. For vanadyl sulfate and uranyl nitrate, ES conditions can be adjusted to produce VO+ and UO2+ as the dominant ions in the mass spectra, indicating that direct speciation of inorganic solution components is possible. On the basis of these preliminary results, it appears that electrospray may offer a low-cost and simple generic ion source for elemental mass spectrometry.

Elemental mass spectrometry using a nitrogen microwave-induced plasma as an ion source

1994 ◽  
Vol 49 (9) ◽  
pp. 901-914 ◽  
Author(s):  
Konosuke Oishi ◽  
Toyoharu Okumoto ◽  
Takashi Iino ◽  
Masataka Koga ◽  
Toshihiro Shirasaki ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Ion Source ◽  
Microwave Induced Plasma ◽  
Elemental Mass ◽  
Elemental Mass Spectrometry

Liquid Sampling-Atmospheric Pressure Glow Discharge Ionization Source for Elemental Mass Spectrometry

2011 ◽  
Vol 83 (7) ◽  
pp. 2425-2429 ◽  
Author(s):  
R. Kenneth Marcus ◽  
C. Derrick Quarles ◽  
Charles J. Barinaga ◽  
Anthony J. Carado ◽  
David W. Koppenaal
Keyword(s):  
Mass Spectrometry ◽  
Glow Discharge ◽  
Atmospheric Pressure ◽  
Atmospheric Pressure Glow Discharge ◽  
Ionization Source ◽  
Pressure Glow Discharge ◽  
Elemental Mass ◽  
Elemental Mass Spectrometry ◽  
Liquid Sampling

A test apparatus for secondary ion mass spectrometry

1983 ◽  
Vol 61 (4) ◽  
pp. 535-542 ◽  
Author(s):  
N. Klaus ◽  
J. D. Brown
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Low Cost ◽  
Ion Source ◽  
Channel Electron Multiplier ◽  
Electron Multiplier ◽  
Spherical Source ◽  
Ion Mass Spectrometry ◽  
Cylindrical Source ◽  
Secondary Ion

A low cost test device for secondary ion mass spectrometry (SIMS) components is described. It consists of a turbomolecular pumped vessel containing an insulated sample stage on an x−y manipulator, extraction optics, quadrupole mass filter, and channel electron multiplier. The construction and characteristics of a cylindrical and a spherical saddlefield ion source are described. The output of the cylindrical source is 10−4 A cm−2 whereas that of the spherical source is in the order of 10−3 A cm−2 at voltages up to 9 kV and at a beam divergence of 4°.

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