Influence of thermal diffuse scattering and local stress on the precise measurement of Si1-xGex composition by convergent beam electron diffraction
2006 ◽
Vol 4
◽
pp. 359-364
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2010 ◽
Vol 43
(2)
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pp. 280-284
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2003 ◽
Vol 9
(5)
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pp. 390-398
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2006 ◽
Vol 62
(3)
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pp. 201-207
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1982 ◽
Vol 40
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pp. 684-685
1986 ◽
Vol 44
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pp. 688-691
1992 ◽
Vol 50
(2)
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pp. 1152-1153
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1995 ◽
Vol 53
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pp. 444-445
1996 ◽
Vol 54
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pp. 1002-1004
1990 ◽
Vol 48
(4)
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pp. 20-21